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Your search keyword '"A. M. Gaskov"' showing total 3 results
Start Over Author "A. M. Gaskov" Topic general chemistry
3 results on '"A. M. Gaskov"'

1. Characterization of the H2 sensing mechanism of Pd-promoted SnO2 by XAS in operando conditions

Author

Andrey Ryzhikov, Bernard Chenevier, Olga V. Safonova, Aleksandre M. Gaskov, M. Labeau, and Thomas Neisius

Subjects
Time Factors, Absorption spectroscopy, Analytical chemistry, Sensitivity and Specificity, Catalysis, Mass Spectrometry, Electrical resistivity and conductivity, Materials Chemistry, Thin film, X-ray absorption spectroscopy, Chemistry, Spectrum Analysis, X-Rays, Metals and Alloys, Electric Conductivity, Tin Compounds, Membranes, Artificial, General Chemistry, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Characterization (materials science), Pd nanoparticles, Ceramics and Composites, Nanoparticles, Palladium, Hydrogen
Abstract

The effect of Pd nanoparticles on the H2 sensitivity of SnO2 thin films was studied in real working conditions using X-ray Absorption Spectroscopy (XAS), electrical conductivity measurements and mass-spectrometry.

Published
2005

2. Auger Electron Spectroscopy of Cut and Polished PbTe Surfaces

Author

A. M. Gaskov and A. Engel

Subjects
chemistry.chemical_classification, Auger electron spectroscopy, Chemistry, Analytical chemistry, General Materials Science, General Chemistry, Condensed Matter Physics, Chemical composition, Inorganic compound, Single crystal
Published
1986

3. Structure and Composition of Polished PbS Surfaces

Author

A. M. Gaskov, Y. Tomm, and A. Engel

Subjects
chemistry.chemical_classification, Reflection high-energy electron diffraction, Chemistry, Polishing, General Chemistry, Condensed Matter Physics, Isotropic etching, Crystallography, General Materials Science, Sublimation (phase transition), Composite material, Chemical composition, Single crystal, Inorganic compound
Abstract

{100} surfaces, produced from sublimation grown PbS single crystals by cutting, mechanical and chemical polishing, were characterized with regard to topography, structure and chemical composition. For this purpose, some methods independent from another were used, for instance profile measuring, dislocation etching, X-ray rocking-curves, RHEED, Rutherford backscattering (RBS), and AES. The results allow to describe the change of structural perfection with the depth (damage depth), the concentration profile of the main components (half-quantitatively), and the significant decreasing of contamination. Following from this study, the model of the damage layer near the surface discussed earlier for PbTe is modified slightly.

Published
1986

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