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This paper reports on the discovery of ambiguity in the traditional definitions of the ‘Angle of diffraction’ in Physical/Wave optics and ‘Glancing angle’ in X-ray crystallography. Just like the 2005 discovery by the author regarding the ambiguity in the traditional definitions of angles of incidence, reflection and refraction, the traditional definitions of the aforesaid two angles have also been found to be ambiguous. The long-running definition of angle of diffraction in Physical/Wave optics does not have any parity with the definitions of angles of incidence, reflection, and refraction in Geometrical optics, in each of which the direction of the positive unit normal to the reflecting surface (surface of discontinuity) at the point of incidence is one of the two directions to be considered in defining the angle. Similarly the traditional definition of the Glancing/Grazing angle in X-ray crystallography is in conflict with the fundamental definition of angle in geometry. With a view to getting rid of the ambiguity present in the traditional definitions of ‘Angle of diffraction’ and ‘Glancing/Grazing angle’, as well as to enhance and sophisticate the relevant field of study, unambiguous definitions of both these two angles have been offered in this paper. [ABSTRACT FROM AUTHOR]

Abstract: Recent experimental sputtering yield data for Si sputtered by 30keVGa FIB shows a discrepancy with binary collision (BC) simulations for angles greater than 85°. This study investigates the factors of BC simulations that could be responsible for the discrepancy at glancing angles, including surface roughness, Ga implantation, electronic stopping, and surface binding energy. It is concluded that the dominant factor at glancing angles is surface roughness. Two roughness models, sinusoidal and pink noise, are used to demonstrate that very small amplitude (∼2Å) roughness is required to obtain quantitative agreement with experiments at very glancing angles. Furthermore, it is shown that large amplitude roughness should be unstable under glancing angle beams. [Copyright &y& Elsevier]

Transparent polycrystalline TiO2 thin films have been deposited on unheated glass substrates using RF reactive magnetron sputtering. Depositions were carried out at different glancing angles and with different total gas mixture pressures. The variation of these parameters affected the crystal phase composition and the surface morphology. Depending on the glancing angle and the pressure, rutile, mixed anatase/ rutile and pure anatase were deposited at low substrate temperature. Both hydrophilic and hydrophobic TiO2 were obtained, exhibiting fast photoconversion to superhydrophilic upon UV irradiation. The effect of the materials physicochemical properties on the wettability and rate of the UV induced superhydrophilicity is evaluated. [ABSTRACT FROM AUTHOR]

Tungsten oxide thin films are prepared by glancing‐angle reactive magnetron sputtering at room temperature. The surface and cross‐section morphologies are characterized by FE‐SEM and TEM. The electrochromic properties of the thin films are studied using a three‐electrode system in 1 m LiClO4/PC solution. When the glancing angle is kept at 80°, a nanocolumnar structured film is obtained. This nanocolumnar structured film shows a lower driving potential and better stability compared to the dense film. The charge capacity per unit area of the nanocolumnar structured film is determined to be 30.85 mc cm−2. The diffusion rates of injection and detachment of ions are determined to be Din = 6.57 × 10−10 cm2 s−1 and Dde = 6.55 × 10−10 cm2 s−1 under an applied potential of ±1.2 V, respectively. The optical modulation amplitude of the nanocolumnar structured film reaches 65% at a wavelength of 600 nm and the optical density is superior to that of the dense film. [ABSTRACT FROM AUTHOR]