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It is demonstrated in this paper that it is possible to synthesize a stochastic flash ADC entirely from Verilog code and a standard digital library. An analog comparator is introduced that is constructed from two cross-coupled 3-input digital NAND gates, and can be described in Verilog. The synthesized comparators have random, Gaussian offsets that are used as virtual voltage references to make a flash ADC. A piecewise-linear inverse Gaussian CDF function is used to correct the nonlinearity introduced by the Gaussian offset distribution. The prototype IC is fabricated in 90 nm CMOS and implements a 2047-comparator version of the proposed architecture. All components including the comparators, the ones adder, and the peicewise inverse Gaussian function are all implemented in Verilog. Conventional digital synthesis and place-and-route is then used to generate the physical layout, making this the first fully synthesized ADC. SNDR of 35.9 dB (without calibration) is achieved at 210 MSPS from the Verilog synthesized design.

In this paper the fundamental concept of ring amplification is introduced and explored. Ring amplifiers enable efficient amplification in scaled environments, and possess the benefits of efficient slew-based charging, rapid stabilization, compression-immunity (inherent rail-to-rail output swing), and performance that scales with process technology. A basic operational theory is established, and the core benefits of this technique are identified. Measured results from two separate ring amplifier based pipelined ADCs are presented. The first prototype IC, a simple 10.5-bit, 61.5 dB SNDR pipelined ADC which uses only ring amplifiers, is used to demonstrate the core benefits. The second fabricated IC presented is a high-resolution pipelined ADC which employs the technique of Split-CLS to perform efficient, accurate amplification aided by ring amplifiers. The 15-bit ADC is implemented in a 0.18 μm CMOS technology and achieves 76.8 dB SNDR and 95.4 dB SFDR at 20 Msps while consuming 5.1 mW, achieving a FoM of 45 fJ/conversion-step.

A low-power synthesizable analog-to-digital converter (ADC) is presented. By cascading many digital-like domino-logic cells whose propagation delay is influenced by an analog input voltage, a digital value is obtained at the end of the allowed ripple period by determining the number of cells that the ripple passed through. The sample-and-hold is simply a bootstrapped switch into a small sampling capacitor. As each domino-logic cell passes the ripple, charge is kicked back onto the input capacitor, which creates a significant second harmonic. Distortion caused by even harmonics is canceled by implementing a pseudodifferential structure. A test chip is fabricated in 0.18-μm CMOS. The test chip achieves over 5.4-bit effective number of bits up to 50 MS/s with a 1.3-V supply. With a sampling frequency of 50 MS/s and a 24-MHz input, a 34.2-dB signal-to-noise-plus distortion ratio is achieved while consuming 433 μW and occupying only 0.094 mm2.

Building on the technique of correlated level shifting (CLS), Split-CLS is introduced as a viable way to enable the design of high performance, high resolution A/D converters in deep submicron CMOS processes. One possible implementation of Split-CLS is presented, which achieves very high effective gain, and combines the fast, high efficiency charging of a zero-crossing based circuit (ZCBC) with the high-accuracy, low power settling of a double-cascode telescopic opamp. A dynamic zero-crossing detector (ZCD) conserves power in the ZCBC by only creating high bandwidth in the ZCD near the zero-crossing instant. Measured results are presented from a pipelined A/D converter fabricated in 0.18 m CMOS. Using the Split-CLS structure, an opamp with 300 mV output swing is used to produce a pipeline stage output swing of 1.4 V. The proof-of-concept test chip achieves 68.3 dB SNDR (11.1b ENOB) and 76.3dB SFDR while sampling at 20 MHz, and consumes 17.2 mW at 1.8 V supply.

A ring amplifier based pipelined ADC is presented that uses simple cells constructed from small inverters and capacitors to perform amplification. The basic ring amplifier structure is characterized and demonstrated to be highly scalable, power efficient, and compression-immune (inherent rail-to-rail output swing). The prototype 10.5-bit ADC, fabricated in 0.18µm CMOS technology, achieves 61.5dB SNDR at a 30MHz sampling rate and consumes 2.6mW, resulting in a FoM of 90fJ/conversion-step.

The relation between opamp noise and the size of the level shifting capacitor in correlated level-shifting (CLS) architectures is explored. Analysis is performed for a Split-CLS switched capacitor amplification circuit, and many of the conclusions in this paper are applicable to more general CLS architectures as well. A theoretical model for noise is developed and shown to be in good agreement with simulation. It is found that for practical design values, the size of the level-shifting capacitor only weakly influences noise performance.

Scaling in CMOS technologies has made the application of traditional opamp topologies increasingly difficult. In the face of decreasing voltage headroom and intrinsic device gain, designers have employed techniques such as gain-boosting, correlated double sampling , and correlated level-shifting (CLS) [1] to maximize output swing for a given gain specification. Zero-crossing based circuits (ZCBC) remove the opamp altogether and use a comparator and current sources [2], which are more amenable to scaling and have proven capable of high efficiency, as in [3]. However, the open loop nature of ZCBC creates challenges for designs that must reliably track over process, voltage, and temperature. In this paper, we describe a hybrid CLS-opamp/ZCBC pipelined ADC that introduces techniques to improve accuracy, robustness, and power efficiency in scaled technologies. It incorporates CLS and a low power, small output swing double-cascoded telescopic opamp to achieve very high effective gain. A dynamically biased zero-crossing detector (ZCD) is introduced that increases the power efficiency of ZCBC designs.

A 6-bit stochastic flash ADC is presented. By connecting many comparators in parallel, a reference ladder is avoided by allowing random offset to set individual trip points. The ADC transfer function is the cumulative density function of comparator offset. A technique is proposed to improve transfer function linearity by 8.5 dB. A test chip, fabricated in 0.18 mum CMOS, achieves ENOB over 4.9 b up to 18 MS/s with 900 mV supply and comparator offset standard deviation of 140 mV Comparators are digital cells to allow automated synthesis. Total core power consumption when fs = 8 MHz is 631muW.