1. PRECISE STRUCTURE ANALYSES OF ADVANCED MATERIALS UNDER HIGH-PRESSURE AND HIGH-TEMPERATURE.
- Author
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YOSHIASA, AKIRA, MURAI, KEI-ICHIRO, ARIMA, HIROSHI, and KATAYAMA, YOSHINORI
- Subjects
STRUCTURAL analysis (Engineering) ,HIGH pressure (Science) ,HIGH temperatures ,X-ray diffraction ,SYNCHROTRON radiation ,PHONONS - Abstract
Precise structure analyses of advanced materials under pressure were performed using each advantage of X-ray absorption fine structure (XAFS) and diffraction methods. Measurements were performed in-situ under pressure and temperature using a large-volume multi-anvil pressure apparatus and synchrotron radiation. XAFS spectra are useful for phase study under high temperature and high pressure. The XAFS Debye Waller factor provides anharmonic effective pair potential with a pressure-dependent and temperature-independent shape. The phonon energies and anharmonicity are affected largely by the change in local structure and bonding character. [ABSTRACT FROM AUTHOR]
- Published
- 2011
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