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In this letter, we report the single-mode operation of 1.55-μm buried heterostructure vertical-cavity surface-emitting lasers (VCSELs) fabricated on a GaAs-AlAs distributed Bragg reflector using thin-film wafer fusion. A 7-μm VCSEL exhibits a single transverse mode at up to about 0.1-mW maximum optical output power and 75°C maximum operation temperature under continuous-wave operation [ABSTRACT FROM PUBLISHER]

We report a record low threshold current of 1.55-μm vertical-cavity surface-emitting laser (VCSEL). Thin-film wafer-fusion technology enables InP-based buried heterostructure VCSELs to be fabricated on GaAs-AlAs distributed Bragg reflectors. Threshold current density is independent of mesa size, and a 5-μm VCSEL exhibits a threshold current as low as 380 μA at 20°C and a single transverse mode up to the maximum optical output power under continuous-wave operation [ABSTRACT FROM PUBLISHER]

The polarization stability of 850-nm InAlGaAs strained quantum-well (QW) vertical-cavity surface-emitting laser (VCSEL) grown on GaAs (311)B substrate was investigated by comparing it with that of GaAs unstrained QW VCSEL grown on GaAs (311)B substrate. Photoluminescence measurement showed that strained QWs grown on GaAs (311)B substrate had larger anisotropy in optical gain than unstrained QWs. The VCSEL with strained QWs showed an orthogonal polarization suppression ratio (OPSR) as high as 21 dB under CW operation. Time-dependent OPSR measurement indicated that the strained QW VCSEL had higher polarization stability than the unstrained QW VCSEL under zero-bias modulation [ABSTRACT FROM PUBLISHER]

All metal-organic chemical vapor deposition (MOCVD) grown 850-nm-wavelength refractive-index-guided semiconductor-buried vertical-cavity surface-emitting laser is proposed and their performance is investigated. P/n-InGaP current-blocking region enables both selective regrowth and the formation of refractive-index-guided region which surrounds multiquantum-well active/core regions. We have achieved room temperature CW operation of the new types of vertical-cavity surface-emitting lasers. The minimum threshold current was 9.5 mA with 18 μm square mesa size at 30°C. The device lased at up to 70°C, and the maximum output power exceeds 1 mW at above 30°C. The near field pattern indicates the single-lobed output beam at low bias current [ABSTRACT FROM PUBLISHER]

The polarization stability of 850-nm GaAs-based vertical-cavity surface-emitting lasers (VCSELs) under dynamic operation was investigated by comparing the characteristics of VCSELs grown on (311)B and (100) GaAs substrates. Significantly larger suppression ratios of the two orthogonal polarization modes was obtained for VCSELs on (311)B substrates than those on (100) substrates under zero-bias modulation. Time-dependent orthogonal polarization suppression ratio measurements also showed that the polarization direction was more stable in the VCSEL on (311)B substrates than that on (100) substrates. Error-free transmission was realized from VCSELs on (311)B substrates with and without a polarizer in both back-to-back and 100-m multimode fiber transmission [ABSTRACT FROM PUBLISHER]