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This paper describes the design and performance of two new high-resolution interline charge-coupled device image sensors for use in industrial, machine vision, and aerial photography applications. These sensors feature 4.5- $\mu \text{m}$ pixels, 4 outputs, fast dump gate, horizontal lateral overflow drain, and vertical electronic shutter. The 43-Mp sensor has a 35-mm optical format and the 50-Mp sensor has a larger format with a 2.175:1 aspect ratio that matches many modern mobile phone displays. This paper discusses the challenges and solutions to manufacture such large sensors with superior image quality such as uniformity, read noise, dark current, smear, transfer gate blooming, lag, and so on. [ABSTRACT FROM AUTHOR]

A 47-million-pixel (47Mp) interline charge-coupled-device (CCD) image sensor, the world’s highest resolution interline-transfer CCD, has been developed for industrial, machine vision, and aerial photography applications. The sensor features a 5.5- \mu \textm pixel, 16-output low-noise amplifier and a low-smear, fast-dump gate, horizontal lateral overflow drain, and ON-chip temperature sensor. One challenge to manufacture this large sensor is stitching the sensor with different lithography tools, while still achieving equal or better image performance than its predecessor. [ABSTRACT FROM AUTHOR]