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Your search keyword '"Maggipinto, Marco"' showing total 3 results

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Start Over You searched for: Author "Maggipinto, Marco" Remove constraint Author: "Maggipinto, Marco" Topic industry 4.0 Remove constraint Topic: industry 4.0 Topic virtual metrology Remove constraint Topic: virtual metrology
3 results on '"Maggipinto, Marco"'

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1. Induced Start Dynamic Sampling for Wafer Metrology Optimization.

2. DeepVM: A Deep Learning-based approach with automatic feature extraction for 2D input data Virtual Metrology.

3. A Computer Vision-Inspired Deep Learning Architecture for Virtual Metrology Modeling With 2-Dimensional Data.

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