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The Fourier-series-based insulated-gate bipolar transistor (IGBT) model has been very effective in simulating its switching behaviors and meanwhile, reflecting carrier dynamics. However, in turn-on process, such a model has difficulty in distinguishing the boundary between undepleted area and depletion layer of the drift region due to Gibbs phenomenon and therefore, cannot accurately describe the carrier behavior of carrier storage region (CSR). In this study, the Fourier-series-based model is modified to determine the more precise depletion layer edge for turn on. This is achieved by utilizing the actual characteristics of the carrier concentration gradient at the edge of CSR in turn-on process. Such a modified model is implemented in MATLAB/Simulink and it can better reflect the depletion layer and simulate the distribution of both the carrier concentration and electric field during turn-on process. It corrects the unreasonable voltage tail caused by the error of drift region voltage calculation in previous models. The results of the proposed model under both the resistive load and inductive load are in good agreement with TCAD. Such a modified model can more accurately simulate both carrier dynamics and switching behaviors in the turn-on process. [ABSTRACT FROM AUTHOR]

The series connection of IGBTs is essential for high-voltage applications where fast switching performances need to be maintained. However, unbalanced voltage sharing is a major resistance to the converter application of this structure. There are a number of causes leading to voltage unbalance, such as different signal delays, parasitic parameters, tail currents, and so on. A temporary clamp scheme performed by active voltage control (AVC) has been proven to be effective in solving the unbalanced voltage-sharing issue. However, the basic physics has not been investigated. In this paper, the physical principle of voltage unbalance within IGBTs series operation is discussed. The carrier storage region differences are concluded to be the intrinsic cause of unbalanced voltage sharing. By using an accurate Fourier-series-based IGBT simulation model with appropriate assumptions, a physical explanation for temporary clamp is provided in detail. At the end of the tail current period when the excess carrier concentration becomes close to the intrinsic doping density, the temporary clamp is able to achieve satisfactory equal voltage sharing. [ABSTRACT FROM PUBLISHER]

Over three decades of development effort has brought insulated gate bipolar transistor (IGBT) technology to a high-level of maturity. IGBT converters have been widely used in industry. However, the high-speed switching transient of the IGBT-freewheel diode chopper cell causes high-level electromagnetic interference (EMI). Electromagnetic compatibility requirements are normally taken into account by utilising costly EMI filters or shielding on the load and supply side. The risk of this traditional method is to incur a delay in commercialising the converters since identification of the failure causes, modifications, and successfully re-testing are required. A promising alternative is to constrain the EMI at source by introducing active voltage control technique and shaping the IGBT switching transient into a sophisticated 'S'-shape. Previously, IGBT switching waveforms have been successfully shaped into an advanced Gaussian 'S'-shape with the EMI greatly reduced. In this study, the authors further investigated the trade-off between EMI generation and switching losses in such an S-shaping method. The investigation was carried out in an accurate physical IGBT/diode model that is able to accurately simulate the device switching transient. From the results, it can be seen that by using the Gaussian S-shaping method the trade-off between EMI and switching losses could be much improved. [ABSTRACT FROM AUTHOR]

The main idea of active voltage control (AVC) is to employ classic feedback-control methods forcing the IGBT collector voltage transient to follow a predefined trajectory. This feedback control of IGBTs has great advantages in guaranteeing that IGBTs remain in safe operating area (SOA), restricting EMI, mitigating the voltage/current stress, minimizing/predicting their power losses, and balancing voltages of IGBTs in series. Inevitably, however, AVC introduces stability issues. Based on the assumption that accurate IGBT small-signal model parameters are available, an analogue proportional-derivative and multiloop feedback control was proposed to achieve stable performance in previous work. Due to nonlinearities and uncertainties in IGBT parameters, previous stability analysis methods have important limitations. This work uses Kharitonov's theorem during the IGBT controlled turn-off to assess the system's stability and guide the AVC design to account for model uncertainties and varying parameters. We conducted experiments to investigate the system's robust stability due to these uncertainties in the IGBT parameters, which confirm the validity of the proposed theoretical analysis. With the use of wide bandwidth op-amps, it is shown that the feedback design may be simplified. [ABSTRACT FROM PUBLISHER]

Insulated-gate bipolar transistor (IGBT) terminal capacitances play an important role in IGBT switching transients. The terminal capacitance modelling is a difficult task because of their operating-point-dependent characteristics. In particular, the input capacitance needs careful treatment if accurate modelling is to be performed. Previously, for the planar gate IGBT, the Miller capacitance's voltage dependency is modelled by considering the depletion region growth pattern. For modern trench gate designs, however, there is no similar dynamic model available. Also, its current dependency needs to be accounted for. This study presents an improved IGBT physics-based model with input capacitance correction. By comparison of experimental and simulation results, the proposed model works well for different types of IGBTs (including the state-of-art trench-gate field-stop type) over a wide range of operating conditions and is convenient to implement. [ABSTRACT FROM AUTHOR]

High-performance power switching devices [insulated-gate bipolar transistors (IGBTs)] realize high-performance power converters. Unfortunately, with a high switching speed of the IGBT-freewheel diode chopper cell, the circuit becomes intrinsic sources of high-level electromagnetic interference (EMI). Therefore, costly EMI filters or shielding is normally demanded on the load and supply sides. An S-shaped voltage transient with a high-order time derivative eliminates the discontinuity in the switching transient and can suppress high-frequency spectrum of EMI emissions. More importantly, it provides an improved tradeoff between EMI generation and switching time, therefore switching losses. This promising tradeoff can be explored further for better high-frequency EMI suppression by using the infinitely differentiable characteristics of Gaussian S-shaped transients. However, current gate drive schemes cannot achieve the S shaping. In this paper, active voltage control is applied and improved successfully to define IGBT switching dynamics with a smoothed Gaussian waveform. [ABSTRACT FROM PUBLISHER]

With series insulated-gate bipolar transistor (IGBT) operation, well-matched gate drives will not ensure balanced dynamic voltage sharing between the switching devices. Rather, it is IGBT parasitic capacitances, mainly gate-to-collector capacitance Cgc, that dominate transient voltage sharing. As Cgc is collector voltage dependant and is significantly larger during the initial turn-off transition, it dominates IGBT dynamic voltage sharing. This paper presents an active control technique for series-connected IGBTs that allows their dynamic voltage transition dVce/dt to adaptively vary. Both switch ON and OFF transitions are controlled to follow a predefined dVce/dt. Switching losses associated with this technique are minimized by the adaptive dv /dt control technique incorporated into the design. A detailed description of the control circuits is presented in this paper. Experimental results with up to three series devices in a single-ended dc chopper circuit, operating at various low voltage and current levels, are used to illustrate the performance of the proposed technique. [ABSTRACT FROM AUTHOR]

An existing physics-based insulated gate bipolar transistor (IGBT) model, which has been proven accurate for both inductive turn-off and inductive turn-on simulations, is modified to account for planar-gate IGBT 2-D effects at the MOS end of the drift region. The modification is based on a steady-state solution of carrier distribution in the JFET region of the IGBT. The accuracy of this solution is verified through a set of finite element simulations. The improved accuracy of the modified model in terms of on-state forward drop and voltage tail at turn-on is verified through comparison with experimental results. [ABSTRACT FROM PUBLISHER]

compact trench-gate insulated-gate bipolar transistor model that captures MOS-side carrier injection is developed. The model retains the simplicity of a 1-D solution to the ambipolar diffusion equation, but at the same time, captures the MOS-side carrier injection and its effects on steady-state carrier distribution in the drift region and on switching waveforms. [ABSTRACT FROM AUTHOR]

In this paper, a new thermal model based on the Fourier series solution of heat conduction equation has been introduced in detail. 1-D and 2-D Fourier series thermal models have been programmed in MATLAB/Simulink. Compared with the traditional finite-difference thermal model and equivalent RC thermal network, the new thermal model can provide high simulation speed with high accuracy, which has been proved to be more favorable in dynamic thermal characterization on power semiconductor switches. The complete electrothermal simulation models of insulated gate bipolar transistor (IGBT) and power diodes under inductive load switching condition have been successfully implemented in MATLAB/Simulink. The experimental results on IGBT and power diodes with clamped inductive load switching tests have verified the new electrothermal simulation model. The advantage of Fourier series thermal model over widely used equivalent RC thermal network in dynamic thermal characterization has also been validated by the measured junction temperature. [ABSTRACT FROM AUTHOR]

Recently, a simulation method for power electronic devices has emerged, which has high accuracy and short run times based on a Fourier model of the devices physics. This paper describes the use of the Fourier models for diodes and insulated gate bipolar transistors (IGBTs) and implementation in MATLAB and Simulink in a formal optimization strategy. In particular, this paper investigates coupled circuit, diode, and IGBT behavior. Conclusions are drawn concerning device loading and circuit design, particularly the role stray inductance. [ABSTRACT FROM AUTHOR]

A practical and accurate parameter extraction method is presented for the Fourier-based-solution physics-based insulated gate bipolar transistor (IGBT) and power diode models. The goal is to obtain a model accurate enough to allow switching loss prediction under a variety of operating conditions. In the first step of the extraction procedure, only one simple clamped inductive load test is needed for the extraction of the six parameters required for the diode model and of the 12 and 15 parameters required for the nonpunch-through (NPT) and punch-through (PT) IGBT models, respectively. The second part of the extraction procedure is an automated formal optimization step that refines the parameter estimation. Validation with experimental results from various structures of IGBT demonstrates the accuracy of the proposed IGBT and diode models and the robustness of the parameter extraction method. [ABSTRACT FROM AUTHOR]

The operation of an insulated gate bipolar transistor (IGBT) in its active region is a well established technique for withstanding short circuits and also for dv/dt control. In this paper, we exploit the active behavior of the IGBT, applying a voltage feed- back Loop to the IGBT to control its switching. It is shown that adding a bias to the demand reference waveform shifts the IGBT into the active region and permits wide bandwidth operation over most of the switching transient. The operation of the IGBT is reported in detail, making reference to a selection of experimental waveforms for 400-A, 1700-V capsule IGBTs. The implementation required for control of such large IGBT modules and capsule devices for high power applications is described and discussed. It is concluded that the active voltage control method allows the operation of high power IGBT circuits to be closely defined. [ABSTRACT FROM AUTHOR]

Presents a study that examined circuit simulator models for the diode and insulated gate bipolar transistor (IGBT) with full temperature dependent features. Simulation of the distributed charge; Results of the study; Conclusion.