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The load coils are employed for multiple loads of resonant wireless power transfer in this paper. With the addition of the load coil, this three-coil structure has easy access to transferring power to multiple loads with the advantages of a compact structure and controllable power flow. Both single-load transfer and multiple-load transfer are modeled and analyzed by means of the circuit theory. The transfer quality factor and the load matching factor are utilized in the analysis of efficiency. In the single-load transfer, the load matching condition is fully explored. Based on the single-load transfer, the multiple-load transfer is researched. The double-load transfer, acting as an illustration, is studied with the uncoupled and coupled load coils. Equivalent reflected resistances are introduced to decouple the model of the double-load transfer with coupled load coils mathematically. An experimental prototype is implemented to verify the aforementioned analysis. The experimental results agree with the theoretical calculations. [ABSTRACT FROM AUTHOR]

The nonlinear junction capacitances of power devices are critical for the switching transient, which should be fully considered in the modeling and transient analysis, especially for high-frequency applications. The silicon carbide (SiC) MOSFET combined with SiC Schottky Barrier Diode (SBD) is recognized as the proposed choice for high-power and high-frequency converters. However, in the existing SiC MOSFET models only the nonlinearity of gate-drain capacitance is considered meticulously, but the drain–source capacitance, which affects the switching commutation process significantly, is generally regarded as constant. In addition, the nonlinearity of diode junction capacitance is neglected in some simplified analysis. Experiments show that without full consideration of nonlinear junction capacitances, some significant deviations between simulated and measured results will emerge in the switching waveforms. In this paper, the nonlinear characteristics of drain–source capacitance in SiC MOSFET are studied in detail, and the simplified modeling methods for engineering applications are presented. On this basis, the SiC MOSFET model is improved and the simulation results with improved model correspond with the measured results much better than before, which verify the analysis and modeling. [ABSTRACT FROM AUTHOR]