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We performed high resolution extreme ultraviolet (EUV) spectroscopy measurements of highly charged xenon ions with a compact electron beam ion trap. The spectra were recorded with a flat-field grazing incidence spectrometer while varying the electron beam energy between 200 and 890 eV. We measured the wavelengths for several lines of Rh-like Xe 9+ - Cd-like Xe 6+ and Cu-like Xe 25+ - Se-like Xe 20+ in the range of 150–200 Å with an uncertainty of 0.05 Å. Previously, most of these lines have been reported from EBITs with a wavelength uncertainty of 0.2 Å. Additionally, based on the electron beam energy dependence of the observed spectra we tentatively identified three new lines, which were reported as unidentified lines in the previous studies. [ABSTRACT FROM AUTHOR]

Intensity ratio of density sensitive emission lines emitted from Fe ions in the extreme ultraviolet region is important for astrophysics applications. We report high-resolution intensity ratio measurements for Fe ions performed at Tokyo EBIT laboratory by employing a flat-field grazing incidence spectrometer. The experimental intensity ratios of Fe X and Fe XII are plotted as a function of electron density for different electron beam currents. The experimental results are compared with the predicted intensity ratios from the model calculations. [ABSTRACT FROM AUTHOR]