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We studied degradation mechanisms of ultraviolet InGaN laser diodes emitting in the UVA range. Short wavelength nitride devices are subjected to much faster degradation, under the same packaging and testing conditions, than their longer wavelength counterparts. Transmission electron microscopy analysis of the degraded laser diodes showed pronounced damage to facets in the area of the active layer (waveguide, quantum wells, and electron blocking layer). Energy-dispersive X-ray spectroscopy showed that the active layers were heavily oxidized, forming a compound close in composition to Ga2O3 with proportional addition of Al in the respective area. The oxidation depth was roughly proportional to the intensity of the optical field. We propose UV-light-induced water splitting on a semiconductor surface as a mechanism of the oxidation and degradation of these devices.

Quantum technologies containing key GaN laser components will enable a new generation of precision sensors, optical atomic clocks and secure communication systems for many applications such as next generation navigation, gravity mapping and timing since the AlGaInN material system allows for laser diodes to be fabricated over a wide range of wavelengths from the u.v. to the visible. We report our latest results on a range of AlGaInN diode-lasers targeted to meet the linewidth, wavelength and power requirements suitable for quantum sensors such as optical clocks and cold-atom interferometry systems. This includes the [5s2S1/2-5p2P1/2] cooling transition in strontium+ ion optical clocks at 422 nm, the [5s2 1S0-5p1P1] cooling transition in neutral strontium clocks at 461 nm and the [5s2s1/2 − 6p2P3/2] transition in rubidium at 420 nm. Several approaches are taken to achieve the required linewidth, wavelength and power, including an extended cavity laser diode (ECLD) system and an on-chip grating, distributed feedback (DFB) GaN laser diode.

Most optoelectronic devices share the same basic epitaxial structure – a stack of quantum wells (QWs) sandwiched between p- and n-doped layers. In nitride semiconductors, where holes have 20-times lower mobility than electrons, the holes are able to populate only the topmost 1–2 QWs. The inability to distribute the holes in a large-enough number of QWs is a cause of high Auger recombination in nitride LEDs. Lateral carrier injection is an alternative design, in which the doped regions are situated at the sides of the QW stack and the carriers diffuse horizontally into the QWs. Given that the carriers are injected into all available QWs, it finally makes sense to grow structures with a large number of QWs. We report the results of our computer simulations, which explore the advantages of LCI-based LEDs in terms of energy efficiency.

Quantum technologies containing key GaN laser components will enable a new generation of precision sensors, optical atomic clocks and secure communication systems for many applications such as next generation navigation, gravity mapping and timing since the AlGaInN material system allows for laser diodes to be fabricated over a wide range of wavelengths from the u.v. to the visible. We report our latest results on a range of AlGaInN diode-lasers targeted to meet the linewidth, wavelength and power requirements suitable for quantum sensors such as optical clocks and cold-atom interferometry systems. This includes the [5s2S1/2-5p2P1/2] cooling transition in strontium+ ion optical clocks at 422 nm, the [5s2 1S0-5p1P1] cooling transition in neutral strontium clocks at 461 nm and the [5s2s1/2 – 6p2P3/2] transition in rubidium at 420 nm. Several approaches are taken to achieve the required linewidth, wavelength and power, including an extended cavity laser diode (ECLD) system and an on-chip grating, distributed feedback (DFB) GaN laser diode.

Quantum technologies containing key GaN laser components will enable a new generation of precision sensors, optical atomic clocks and secure communication systems for many applications such as next generation navigation, gravity mapping and timing since the AlGaInN material system allows for laser diodes to be fabricated over a wide range of wavelengths from the u.v. to the visible. We report our latest results on a range of AlGaInN diode-lasers targeted to meet the linewidth, wavelength and power requirements suitable for quantum sensors such as optical clocks and cold-atom interferometry systems. This includes the [5s2S1/2-5p2P1/2] cooling transition in strontium+ ion optical clocks at 422 nm, the [5s2 1S0-5p1P1] cooling transition in neutral strontium clocks at 461 nm and the [5s2s1/2 – 6p2P3/2] transition in rubidium at 420 nm. Several approaches are taken to achieve the required linewidth, wavelength and power, including an extended cavity laser diode (ECLD) system and an on-chip grating, distributed feedback (DFB) GaN laser diode.

Quantum based devices offer distinct advantages over conventional technology, such as improved sensitivity for sensing applications or enhanced accuracy for metrology. To utilize this potential, a number of technical requirements must be met, such as the cooling and trapping of neutral atoms for their use as quantum systems. We present our work on InGaN-based semiconductor cooling lasers for a variety of atomic species such as strontium, magnesium and ytterbium whos target wavelength was met by quantum-well composition engineering. Results on growth-epitaxy, facet coating as well as different configurations such as ECDL and MOPAs are presented, depending on the requirement of the application.

Our goal is to fabricate a laser diode 2D array which combines the properties of both VCSEL and edge emitting laser. Proposed light emitter will have a horizontal cavity with 450 deflectors. The role of these deflectors would be to deflect light perpendicular to the cavity, achieving vertical out-coupling. The most challenging part of this project is the fabrication of the micro-mirrors which act as both as beam deviating mirrors and cavity forming mirrors. Owing to the excellent thermal conductivity of GaN substrates the properties of such a 2D array should be better than of conventional nitride laser diode arrays, not even mentioning nitride-based stacked bars systems. In this paper I will describe our new device design and processing, giving insight to its possible applications and advantages over simple light emitting laser diode.

In this work, we investigate the role of the electron blocking layer (EBL) in laser diodes based on a graded index separate confinement heterostructure. We compare two sets of devices with very different EBL aluminum composition (3% and 12%) and design (graded and superlattice). The results of electro-optical characterization of these laser diodes reveal surprisingly modest role of electron blocking layer composition in determination of the threshold current and the differential efficiency values. However, EBL structure influences the operating voltage, which is decreased for devices with lower EBL and superlattice EBL. We observe also the differences in the thermal stability of devices – characteristic temperature is lower for lasers with 3% Al in EBL.

consumption and financial burden of the multiple light sources required for such systems. The AlGaInN material system allows for single transverse mode laser diodes to be fabricated with optical powers up to 100 mW over a wide range from ~380 nm up to ~530 nm. By tuning the indium content and thickness of the GaInN quantum well, we have developed a range of AlGaInN diode-lasers targeted to meet the wavelength and power requirements suitable for optical clocks and atom interferometry systems. One of the major limiting factors in nitride laser diode development has been the lack of a suitable low defectivity and uniform GaN substrate. Recently, single crystal growth of large area, very low dislocation-density and uniform GaN substrates are grown using a combination of high temperature and high pressure enabling a range of AlGaInN laser technology to be developed. This direct light generation at the required wavelength is crucial to reduce complexity and size of the overall system, and to ensure a high wall-plug efficiency that is critical for space and mobile applications. We will present our development of GaN based, low SWaP, frequency-stabilised external-cavity seed and tapered amplifiers to operate at 461nm for first stage strontium cooling. This includes growth of custom optimised GaN epitaxy for operation at 461 nm, a robust ECDL geometry, a novel tapered amplifier design and important work in characterising the optical performance and minimising surface reflectivity to identify suitable working parameters.

Systems with the ability to observe and manipulate individual quantum states have been brought to applications that include among others satellite-free navigation and high-precision gravimetric sensing. Fundamentally, the applicability of quantum technology is limited by the complexity and financial burden of light sources required for such systems. These sources need to feature high optical power combined with compromised beam quality and frequency-stabilized narrow-linewidths. These parameters directly influence the performance of the quantum technology measurement system. Semiconductor devices are able to provide high brightness over broad spectral regions through band-gap engineering. InGaN-based laser sources can be engineered to operate from 380nm to 530 nm. This aligns well with the transitions of atomic species such as strontium, magnesium and ytterbium. However, a challenge remains to offer the narrow-linewidths ( 100 mW) required for many of these applications. We will present our development of GaN based narrow-linewidth seed and tapered amplifiers to operate at 461nm for first stage strontium cooling. This includes growth of custom optimised GaN epitaxy for operation at 461 nm, a robust ECDL geometry, a novel tapered amplifier design and important work in characterising and minimising the surface reflectivity to identify suitable working parameters. A comprehensive characterization of the device will be presented.

Quantum technologies containing key GaN laser components will enable a new generation of precision sensors, optical atomic clocks and secure communication systems for many applications such as next generation navigation, gravity mapping and timing since the AlGaInN material system allows for laser diodes to be fabricated over a wide range of wavelengths from the u.v. to the visible. We report our latest results on a range of AlGaInN diode-lasers targeted to meet the linewidth, wavelength and power requirements suitable for optical clocks and cold-atom interferometry systems. This includes the [5s2S1/2-5p2P1/2] cooling transition in strontium+ ion optical clocks at 422 nm, the [5s21S0-5p1P1] cooling transition in neutral strontium clocks at 461 nm and the [5s2s1/2-6p2P3/2] transition in rubidium at 420 nm. Several approaches are taken to achieve the required linewidth, wavelength and power, including an extended cavity laser diode (ECLD) system and an on-chip grating, distributed feedback (DFB) GaN laser diode.

In this work, we study how an epitaxial laser-like (or superluminescent diode-like) structure is modified by intentional changes of the substrate misorientation in the range of 0.5°–2.6°. The 40 μm × 40 μm test structure with misorientation profiling was fabricated using multilevel photolithography and dry-etching. The local structural parameters were measured by synchrotron radiation microbeam X-ray diffraction, with the sampling area of below 1 μm × 1 μm . We directly obtained the relation between the misorientation and indium content in the quantum well, changing from 9% to 18%, with a high resolution (small misorientation step). We also show a good agreement of local photoluminescence emission wavelength with simulation of transition energy based on synchrotron radiation microbeam X-ray diffraction (SR-XRD) data and estimated Stokes shift. We observe that the substrate misorientation influences also the InGaN waveguide and AlGaN cladding composition. Still, we showed through simulation of the optical confinement factor of a full laser diode structure that good light guiding properties should be preserved in the whole misorientation range studied here. This proves the usefulness of misorientation modification in applications like broadband superluminescent diodes or multicolor laser arrays.

We report a thorough study of InGaN quantum wells spatially modified by varying the local misorientation of the GaN substrate prior to the epitaxial growth of the structure. More than 25 nm shift of emission wavelength was obtained, which is attributed to indium content changes in the quantum wells. Such an active region is promising for broadening of the emission spectrum of (In,Al,Ga)N superluminescent diodes. We observed that the light intensity changes with misorientation, being stable around 0.5° to 2° and decreasing above 2°. This relation can be used as a base for future device designing.

Quantum technologies containing key GaN laser components will enable a new generation of precision sensors, optical atomic clocks and secure communication systems for defence applications such as next generation navigation, gravity mapping and timing since the AlGaInN material system allows for laser diodes to be fabricated over a wide range of wavelengths from the u.v. to the visible. We report our latest results on a range of AlGaInN diode-lasers targeted to meet the linewidth, wavelength and power requirements suitable for optical clocks and cold-atom interferometry systems. This includes the [5s2S1/2-5p2P1/2] cooling transition in strontium+ ion optical clocks at 422 nm, the [5s21S0-5p1P1] cooling transition in neutral strontium clocks at 461 nm and the [5s2s1/2 – 6p2P3/2] transition in rubidium at 420 nm. Several approaches are taken to achieve the required linewidth, wavelength and power, including an extended cavity laser diode (ECLD) system and an on-chip grating, distributed feedback (DFB) GaN laser diode.

The AlGaInN material system allows for laser diodes to be fabricated over a very wide range of wavelengths from UV, ~380 nm, to the visible ~530 nm, by tuning the indium content of the laser GaInN quantum well. This makes nitride laser diodes suitable for a vast range of applications, but most of them require not only the proper wavelength emission, but also high optical power and good beam quality. The typical approach - wide ridge waveguide - often suffers from spatial multimode emission (low beam quality). We report our initial results with tapered GaN lasers to increase the maximum optical power of the device with a good beam profile. This combination opens new possibilities for GaN laser diode technology in quantum technologies including optical atomic clocks and quantum gravity sensors.

GaN laser diodes fabricated from the AlGaInN material system is an emerging technology for high power, optical integration and quantum applications. The AlGaInN material system allows for laser diodes to be fabricated over a very wide range of wavelengths from u.v., ~380nm, to the visible ~530nm, by tuning the indium content of the laser GaInN quantum well, giving rise to new and novel applications including displays and imaging systems, free-space and underwater telecommunications and the latest quantum technologies such as optical atomic clocks and atom interferometry.

The recombination rate coefficients (RRCs) A, B, and C in MOVPE-grown single-quantum-well light emitting diodes spanning the entire blue-green spectral range are determined by fitting efficiency curves and differential carrier lifetimes. The results show definite trends for each of the RRCs: A tendentially decreases with increasing wavelength, B definitely decreases, and C remains approximately constant. Therefore, the increase of the droop with increasing wavelength (the green gap problem) is rather due to the decrease of B than an increase of C. The determined values of C are shown to be similar to what has been predicted by others with first-principles computer simulations accounting for phonon-assisted Auger recombination. Samples grown on sapphire and silicon substrates are compared and show significant differences only for the RRC A, presumably due to the difference in threading dislocation density.

In this work, we fabricated green-light-emitting laser structures on a (20-21) semipolar GaN substrate. Using cathodoluminescence mapping, x-ray diffraction, and transmission electron microscopy, we revealed the formation of relaxation defects within InGaN waveguides and AlGaN claddings. The observed defects in the AlGaN layers are stripe-like and extend along the a axis, but in the InGaN layers they form a characteristic checkered pattern. We demonstrate that using the selective area growth method we can effectively suppress the formation of both types of defects, thus enabling the fabrication of defect-free green laser structures on semipolar GaN substrates.

We report on a green light-emitting device, in which the light of an efficient blue 1 mm2 GaInN/GaN light-emitting diode (LED) is converted into green light by an optically pumped GaInN/GaN multiple quantum well structure. This solution reached an efficacy of 127 lm/W, i.e., higher than that of state-of-the-art 1 mm2 GaInN/GaN LEDs emitting directly at the target wavelength, at 350 mA current and 535 nm peak wavelength. Optically pumped converters overcome the design limitations of typical multiple quantum well LEDs, where carrier transport issues limit the maximum number of functioning wells and might help to solve the problem of the green gap.