1. Photoluminescence imaging of focused ion beam induced individual quantum dots
- Author
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Deborah Tien, Vanessa Sih, Joanna Mirecki Millunchick, Jieun Lee, Timothy W. Saucer, and Andrew J. Martin
- Subjects
Materials science ,Photoluminescence ,business.industry ,Phonon ,Mechanical Engineering ,Bioengineering ,General Chemistry ,Condensed Matter::Mesoscopic Systems and Quantum Hall Effect ,Condensed Matter Physics ,Focused ion beam ,law.invention ,Optics ,Thermal conductivity ,Confocal microscopy ,law ,Quantum dot ,Thermoelectric effect ,General Materials Science ,Emission spectrum ,business - Abstract
We report on scanning microphotoluminescence measurements that spectrally and spatially resolve emission from individual InAs quantum dots that were induced by focused ion beam patterning. Multilayers of quantum dots were spaced 2 μm apart, with a minimum single dot emission line width of 160 μeV, indicating good optical quality for dots patterned using this technique. Mapping 16 array sites, at least 65% were occupied by optically active dots and the spectral inhomogeneity was within 30 meV.
- Published
- 2011