Search

The structure of precursors is used to control the formation of six possible structural isomers that contain four structural units of PbSe and four structural units of NbSe2: [(PbSe)1.14]4[NbSe2]4, [(PbSe)1.14]3[NbSe2]3[(PbSe)1.14]1[NbSe2]1, [(PbSe)1.14]3[NbSe2]2[(PbSe)1.14]1[NbSe2]2, [(PbSe)1.14]2[NbSe2]3[(PbSe)1.14]2[NbSe2]1, [(PbSe)1.14]2[NbSe2]2[(PbSe)1.14]1[NbSe2]1[(PbSe)1.14]1[NbSe2]1, [(PbSe)1.14]2[NbSe2]1[(PbSe)1.14]1[NbSe2]2[(PbSe)1.14]1[NbSe2]1. The electrical properties of these compounds vary with the nanoarchitecture. For each pair of constituents, over 20 000 new compounds, each with a specific nanoarchitecture, are possible with the number of structural units equal to 10 or less. This provides opportunities to systematically correlate structure with properties and hence optimize performance. [ABSTRACT FROM AUTHOR]

The structures of three new misfit layer compounds, [(PbSe)0.99]1[WSe2]1, [(PbSe)1.00]1[MoSe2]1, and [(SnSe)1.03]1[MoSe2]1, prepared as thin films from designed elementally modulated reactant precursors, have been investigated by synchrotron X-ray diffraction and scanning transmission electron microscopy. This is the second report of a misfit layer compound based on tin selenide and the first structure determinations of tungsten- and molybdenum-containing misfit layer compounds. The compounds have mismatches in both the a- and b-axis (in-plane) lattice parameters of the component structural units, which result in misfit parameters, δ, both greater and smaller than zero. Pole figures of hk0-type reflections indicate that c-axis-oriented (basal plane) dichalcogenide-structured units are randomly oriented within the a- b plane. The widths of diffraction peaks of type hk0, 00 l, and hkl ( h, k ≠ 0; l ≠ 0) indicate coherence lengths of approximately (6 to 7) nm within the a- b plane, the full thickness of the film along the c-axis, and (1 to 2) nm in mixed-index directions, respectively, consistent with random rotational disorder between the constituents, commonly termed turbostratic disorder in the clay literature. The intensities of 00 l- and hk0-type diffraction peaks were modeled to determine the structure of atomic planes along the c axis and the projection of the constituent structures onto the a- b plane, respectively. [ABSTRACT FROM AUTHOR]

Inorganic Isomers In their Communication on page 1130 ff., D. C. Johnson et al. describe the preparation of structural inorganic isomers with NbSe2 trilayers and PbSe bilayers from designed precursors. [ABSTRACT FROM AUTHOR]

The structures of three new misfit layer compounds, [(PbSe)0.99]1[WSe2]1, [(PbSe)1.00]1[MoSe2]1, and [(SnSe)1.03]1[MoSe2]1, prepared as thin films from designed elementally modulated reactant precursors, have been investigated by synchrotron X-ray diffraction and scanning transmission electron microscopy. This is the second report of a misfit layer compound based on tin selenide and the first structure determinations of tungsten- and molybdenum-containing misfit layer compounds. The compounds have mismatches in both the a- and b-axis (in-plane) lattice parameters of the component structural units, which result in misfit parameters, δ, both greater and smaller than zero. Pole figures of hk0-type reflections indicate that c-axis-oriented (basal plane) dichalcogenide-structured units are randomly oriented within the a- b plane. The widths of diffraction peaks of type hk0, 00 l, and hkl ( h, k ≠ 0; l ≠ 0) indicate coherence lengths of approximately (6 to 7) nm within the a- b plane, the full thickness of the film along the c-axis, and (1 to 2) nm in mixed-index directions, respectively, consistent with random rotational disorder between the constituents, commonly termed turbostratic disorder in the clay literature. The intensities of 00 l- and hk0-type diffraction peaks were modeled to determine the structure of atomic planes along the c axis and the projection of the constituent structures onto the a- b plane, respectively. [ABSTRACT FROM AUTHOR]