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Abstract: Degradation process of organic light-emitting diodes (OLEDs) is examined directly by X-ray photoelectron spectroscopy with in situ high-energy C60 + and low-energy Ar+ co-sputtering. It is proven that this analytical technique clearly indicates the elemental depth profile of as-prepared OLED device (Al/LiF/2,2′,2′′-(1,3,5-benzinetriyl)-tris(1-phenyl-1-H-benzimidazole) (TPBi)/4,4′-bis(carbazol-9-yl)biphenyl:bis(3,5-difluoro-2-(2-pyridyl)-phenyl-(2-carboxypyridyl) iridium (III) (CBP:FIrpic)/poly(ethylenedioxythiophene): poly(styrene sulfonic acid) (PEDOT:PSS)/ITO). Devices operated for different durations are subjected to this profiling technique for studying the change of elemental distribution. In addition to some of the accepted degradation mechanisms, it is observed that small TPBi molecules migrate towards the ITO anode under a direct driving voltage while retaining its original structure. It is also observed that oxygen diffused into the device through the Al cathode and along the Al–organic interface. Molecules with high stereo-hindrance may have less degradation due to the electron migration. [Copyright &y& Elsevier]

Abstract: Small molecular organic light-emitting diodes (OLEDs) can be fabricated by spin-coating and thermo-evaporation of organic materials. In this work, X-ray photoelectron spectrometry (XPS) and secondary ion mass spectrometry (SIMS) are used to examine the microstructure of emissive layers in organic LEDs prepared with different technique using in situ sputtering. It is found that the Ir-containing guest molecule is enriched at the bottom-interface and a concentration gradient results from spin-coating while the opposite molecular distribution is observed with thermo-evaporation. Such a difference in microstructure affects the carrier-injection and carrier-transportation and is key to the dramatic difference (∼3.5×) in the efficiency of the resultant OLED devices. [Copyright &y& Elsevier]

Abstract: Over the past years, organic light-emitting diodes (OLEDs) have attracted increasing interest because of their great potential for use in high-quality flat-panel displays and solid-state lighting. One of the basic requirements in any emissive device is to provide adequate stability to ensure a sufficiently long lifetime. Recently, it was observed that small molecules migrate toward the ITO anode under a direct driving voltage while retaining their original structures. To prevent this bias-driven migration of small molecules, a chemical structure with a higher steric hindrance could be introduced as a blockade, thus molecular migration could be suppressed and the device half-life increased. In this work, OLED devices with different hosts, including CBP, mCP, SimCP2, and SimCP, with increasing steric hindrances are fabricated. The spatial distribution of the tracking molecules after operation for different lengths of time is examined by using X-ray photoelectron spectroscopy (XPS) with in situ high-energy and low-energy Ar+ co-sputtering for depth profiling. It is found that the bias-driven molecular migration is suppressed and the device half-life prolonged as the steric hindrance of the host increases. [ABSTRACT FROM AUTHOR]