Search

We report the preparation and characterization of vanadium substituted four-layer Aurivillius compound Bi5Fe1.5V0.5Ti2O15 using spin coating method. Ferroelectricity in the prepared films are confirmed from the well saturated polarization vs electric field (P-E) loops having remnant polarization (2 Pr) around 12.94 µC/cm2 at room temperature. In addition, low temperature P-E measurements show a decrease in Pmax and 2 Pr, which is attributed to the stabilization of defect dipole complexes and domain pinning, as seen in bismuth-based ferroelectrics. Additionally, this decrease in polarization is accompanied by an increase in imprint, confirming the presence of defect dipoles manifested as internal fields. [ABSTRACT FROM AUTHOR]

• Polycrystalline Aurivillius Bi5FeTi3O15 film is prepared with spin-coating. • Saturated ferroelectric (P-E) loops are reported. • Low temperature P-E data reveals freezing of domains. Thin films of four–layered Aurivillius Bi 5 FeTi 3 O 15 compound were prepared using spin coating method. Phase purity of the sample is confirmed via X–ray diffraction and Raman spectroscopy measurements. Ferroelectricity in the prepared film is established from polarization versus electric field (P–E) loop measurements. The remnant and saturation polarization obtained from low temperature P–E measurements reveal a peculiar temperature dependence viz., decreasing on lowering the temperature. Apart from this, a development of an internal field in the system is observed towards lower temperatures which is reflected as biasing in the loops. Further, temperature dependent leakage current measurements have been performed and the analysis into conduction mechanisms shed light into the possible defect related mechanisms responsible for the aforementioned peculiar low temperature ferroelectric behavior. Also, the possibility of multiferroicity in the prepared film is explored with external magnetic field dependent P–E measurements and the results show very weak coupling between polarization and magnetic field. [ABSTRACT FROM AUTHOR]