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Epitaxial (100)/(001)-oriented tetragonal Pb(Zr,Ti)O3 films above 1 μm thick were grown on (100)SrTO3 substrates by pulsed metal organic chemical vapor deposition, and the films with Zr/(Zr+Ti) ratios up to 0.43 were found to have a strain-relaxed domain structure. The domain structure determined by the volume fraction of (001) orientation (mainly decided by the thermal strain above the Curie temperature) and the lattice parameters dependent on the Zr/(Zr+Ti) ratio are explained by a geometrical model consistent with previous results for PbTiO3 films [J. Appl. Phys. 104, 064121 (2008)]. [ABSTRACT FROM AUTHOR]

Epitaxial (100)/(001)-oriented PbTiO3 films with thickness of 2.8 μm were grown on Nb-doped (100) SrTiO3 substrates by pulsed metal organic chemical vapor deposition. Complex domain structures consisting of c-domains (c1) and three types of a-domains (a1, a2, and a3) were observed by piezoresponse force microscopy in conjunction with high-resolution x-ray diffraction analysis. The obtained results suggest that (a2/a3) and (a1/c1) domain configurations represent mostly strain-relaxed structures. This conclusion is in good agreement with theoretical predictions made for thick films [Phys. State., Solidi 37, 329 (1976)]. [ABSTRACT FROM AUTHOR]

(100)/(001)-oriented epitaxial PbTiO3 films thicker than 1 μm were grown on various types of substrates by chemical vapor deposition. The domain structures of these films with different volume fractions of (001) were investigated. Domain structures, consisting of (100)/(001)-oriented domains, were observed regardless of the type of substrate. However, the tilting angles of the a- and c-domains from the surface normal linearly changed with the volume fraction of the (001) orientation. These results suggest that the volume fraction of the (001) orientation is crucial in identifying the domain structure of PbTiO3 thick films. [ABSTRACT FROM AUTHOR]

The authors grew (001)- and (001)/(100)-oriented epitaxial PbTiO3 films with various thicknesses on (100)SrTiO3 substrates. They used x-ray diffraction to measure the angles between surface normal [001] of (001)-oriented domains and [100] of (100)-oriented domains. The angles were found to be approximately 3.6° when the film thickness exceeded 1100 nm. This value is consistent with the value obtained by a geometric calculation for strain-free PbTiO3. This result suggests that thick epitaxial PbTiO3 films grown on (100)SrTiO3 substrates have a fully strain-relaxed structure. [ABSTRACT FROM AUTHOR]