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When short current is interrupted in three-phase vacuum interrupter in switchgear, the “U”-type loop composed of external busbar, conductive rod, and vacuum interrupter, and its adjacent phases will generate external actual transverse magnetic field (EATMF) in the interrupter. The existence of EATMF will deflect the vacuum arc, which will affect the breaking performance of vacuum switch. In view of this situation, this article establishes two kinds of electrode system simulation models considering and not considering EATMF. The simulation results show that EATMF is not uniformly distributed in the interelectrode region, but is stronger in the contact cup edge area outside the “U”-type loop, weaker in the “U”-type loop, and mainly affects ${B} _{x}$. In different short-circuit cases, EATMF is also different due to the difference of phase distance and short current. In the case of three-phase short circuit, the magnetic field in the interelectrode region of the middle phase is most significantly affected by EATMF. EATMF is closely related to the structure size of vacuum switch. By changing the structure size of vacuum switch (e.g., phase spacing ${d}$ , conductive rod length ${h} _{1}$ , ${h} _{2}$), EATMF can be weakened to some extent. [ABSTRACT FROM AUTHOR]