1. Zeolite Chemistry and Catalysis
- Author
-
Arthur W. Chester and E. G. Derouane
- Subjects
Diffraction ,Reciprocal lattice ,Materials science ,Condensed matter physics ,Rietveld refinement ,Neutron diffraction ,Physics::Optics ,Nanotechnology ,Crystal structure ,Crystallite ,Structure factor ,Powder diffraction - Abstract
This tutorial discusses the fundamental principles of X-ray diffraction and its applications in zeolite science. The early sections review the physics of diffraction, crystal symmetry, and reciprocal space. We discuss how the intensity of diffracted radiation is affected both by geometric effects involving detection (the Lorentz-polarization factor) and by the arrangement of atoms within the crystal (the structure factor). The differences between powder diffraction and singlecrystal diffraction are then described, and differences between X-ray and neutron diffraction are also discussed. Later sections describe the effects of symmetry, lattice substitution, crystallite size, residual strain, preferred orientation, and X-ray absorption. Special emphasis is placed on the proper application of the Scherrer analysis in reporting crystalize size. The principles of structure solution from direct methods and Patterson methods are then introduced, and a description of Rietveld analysis is given. Finally the effects of stacking disorder on a powder diffraction pattern are presented.
- Published
- 2009
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