1. Strong Zero-Phonon Transition from Point Defect-Stacking Fault Complexes in Silicon Carbide Nanowires
- Author
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Sang-Yun Lee, Je-Hyung Kim, Woong Bae Jeon, Sang-Wook Han, Junghyun Lee, Jong Sung Moon, Adam Gali, Zoltán Bodrog, and Jin Hee Lee
- Subjects
Materials science ,Condensed matter physics ,Phonon ,Mechanical Engineering ,Nanowire ,Stacking ,Bioengineering ,General Chemistry ,Condensed Matter Physics ,Crystallographic defect ,chemistry.chemical_compound ,chemistry ,Qubit ,Silicon carbide ,General Materials Science ,Electronic band structure ,Stacking fault - Abstract
Crystallographic defects such as vacancies and stacking faults engineer electronic band structure at the atomic level and create zero- and two-dimensional quantum structures in crystals. The combination of these point and planar defects can generate a new type of defect complex system. Here, we investigate silicon carbide nanowires that host point defects near stacking faults. These point-planar defect complexes in the nanowire exhibit outstanding optical properties of high-brightness single photons (360 kcounts/s), a fast recombination time (1 ns), and a high Debye-Waller factor (50%). These distinct optical properties of coupled point-planar defects lead to an unusually strong zero-phonon transition, essential for achieving highly efficient quantum interactions between multiple qubits. Our findings can be extended to other defects in various materials and therefore offer a new perspective for engineering defect qubits.
- Published
- 2021