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Abstract: This paper investigates the applicability of real time wear compensation in micro EDM milling based on discharge counting and discharge population characterization. Experiments were performed involving discharge counting and tool electrode wear measurement in a wide range of process parameters settings involving different current pulse shapes. A strong correlation is found between average discharge energy of the populations and wear and material removal per discharge. A validation was carried out showing the feasibility of the proposed approach. [Copyright &y& Elsevier]

Abstract: This paper presents a theoretical model for cutting force prediction in micro milling, taking into account the cutting edge radius size effect, the tool run out and the deviation of the chip flow angle from the inclination angle. A parameterization according to the uncut chip thickness to cutting edge radius ratio is used for the parameters involved in the force calculation. The model was verified by means of cutting force measurements in micro milling. The results show good agreement between predicted and measured forces. It is also demonstrated that the use of the Stabler''s rule is a reasonable approximation and that micro end mill run out is effectively compensated by the deflections induced by the cutting forces. [Copyright &y& Elsevier]

Abstract: This paper presents the results of an extensive experimental investigation concerning size effects on surface generation by ball nose and flat end micro milling hardened tool steel. Cutting parameters were selected on the basis of a modular description of the uncut chip geometry. A theoretical model of the generated surfaces was used as a reference and compared with measurement results and visual inspection using an SEM. Two main effects have been observed on the tool-work material interaction at micro scale. These are responsible for the limited reduction of the roughness amplitude parameters with tool diameter and occur when the cutting edge radius to uncut chip thickness ratio becomes critical. [Copyright &y& Elsevier]