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Your search keyword '"Jouneau, P.-H."' showing total 3 results
Start Over Author "Jouneau, P.-H." Topic molecular beam epitaxy
3 results on '"Jouneau, P.-H."'

2. Growth, structural, and optical properties of II-VI layers: (001) CdMnTe grown by molecular-beam epitaxy.

Author

Bodin, C., Cibert, J., Grieshaber, W., Si Dang, Le, Marcenat, F., Wasiela, A., Jouneau, P. H., Feuillet, G., Hervé, D., and Molva, E.

Subjects
CADMIUM compounds, MOLECULAR beam epitaxy, OSCILLATIONS, PHOTOLUMINESCENCE, CATHODOLUMINESCENCE
Abstract

Presents a study that described the growth of cadmium-manganese-tellurium by molecular-beam epitaxy. Information on reflection high-energy electron-diffraction oscillations; Spectroscopic properties of cadmium compound alloys; Data on liquid-helium-temperature photoluminescence and liquid-nitrogen-temperature cathodoluminescence; Use of transmission electron microscopy.

Published
1995
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3. Critical thickness in epitaxial CdTe/ZnTe.

Author

Cibert, J., Gobil, Y., Dang, Le Si, Tatarenko, S., Feuillet, G., Jouneau, P. H., and Saminadayar, K.

Subjects
SEMICONDUCTOR junctions, CRYSTAL growth, MOLECULAR beam epitaxy
Abstract

The critical thickness for coherent growth of CdTe on ZnTe by molecular beam epitaxy is assessed by reflection high-energy electron diffraction, low-temperature photoluminescence, and transmission electron microscopy. The value is found to be 5 monolayers for this high mismatch system (6%). As opposed to similar studies on III-V and Si-Ge systems, there is no evidence of island formation before relaxation by dislocations at the interface. [ABSTRACT FROM AUTHOR]

Published
1990
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