1. Megahertz x-ray microscopy at x-ray free-electron laser and synchrotron sources
- Author
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Romain Letrun, Jozef Uličný, Margie P. Olbinado, Rita Graceffa, Patrik Vagovic, Grant Mills, Joachim Schulz, Alexander Rack, Ladislav Mikeš, Adrian P. Mancuso, Frans Mattsson, Rajmund Mokso, Pablo Villanueva-Perez, Tilo Baumbach, Henry N. Chapman, Tokushi Sato, Alke Meents, Henry Kirkwood, Tomáš Faragó, Marie-Christine Zdora, and Alexey Ershov
- Subjects
Materials science ,business.industry ,Physics::Instrumentation and Detectors ,X-RAY LASERS ,Free-electron laser ,Synchrotron radiation ,Nanosecond ,Laser ,ULTRAFAST DETECTOR ,Atomic and Molecular Physics, and Optics ,Synchrotron ,RADIOSCOPY ,Electronic, Optical and Magnetic Materials ,law.invention ,Metrology ,Microsecond ,Optics ,law ,PHASE CONTRAST IMAGING ,ddc:620 ,SHOCK WAVES ,business ,Image resolution - Abstract
Optica 6(9), 1106 - 1109 (2019). doi:10.1364/OPTICA.6.001106, Modern emerging technologies, such as additive manufacturing, bioprinting, and new material production, require novel metrology tools to probe fundamental high-speed dynamics happening in such systems. Here we demonstrate the application of the megahertz (MHz) European X-ray Free-Electron Laser (EuXFEL) to image the fast stochastic processes induced by a laser on water-filled capillaries with micrometer-scale spatial resolution. The EuXFEL provides superior contrast and spatial resolution compared to equivalent state-of-the-art synchrotron experiments. This work opens up new possibilities for the characterization of MHz stochastic processes on the nanosecond to microsecond time scales with object velocities up to a few kilometers per second using XFEL sources., Published by OSA, Washington, DC
- Published
- 2019
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