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There have been two effects of the external electric field influence on the diffraction efficiency of reconstructed holograms observed in the films of copolymers 4-[(2-nitrophenyl)diazenyl]phenyl methacrylate with octylmethacrylate, when holographic recording of the plane wave front for parallel and orthogonal orientation of polarization vectors of light beams was performed at room temperature. After recording at exposure with small energies, diffraction efficiency in the electric field formed by corona discharge decreases, while with large exposure energies, it increases. Diffraction efficiency and recording velocity are higher in copolymer with lower softening temperature. The first effect is caused by reorientation of the dipole moments of azobenzene isomer fragments in the electric field, while the growth of diffraction efficiency is explained by the increase in the amplitude of regular geometric relief of the film surface, which appears during formation of the polarization hologram.

Thermal dependent changes of light depolarization degree were observed in the SnO2:In2O3 (ITO) layers deposited onto the flat glass substrates which are used usually as electrodes for optoelectronic devices. The observed effect is reversible. It can be attributed to the changes of nanostructure geometry in the bulk of the ITO layer as well as on its surface. Such geometric changes involve dispersion of polarized light. The investigated effect should be taken into consideration when developing optoelectronic devices because it can provoke distortion of the optical information field.