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The morphology and crystalline quality of p-GaN shells on coaxial GaInN/GaN multiple quantum shell (MQS) nanowires (NWs) were investigated using metal-organic chemical vapor deposition. By varying the trimethylgallium (TMG) flow rate, Mg doping, and growth temperature, it was verified that the TMG supply and growth temperature were the dominant parameters in the control of the p-GaN shape on NWs. Specifically, a sufficiently high TMG supply enabled the formation of a pyramid-shaped NW structure with a uniform p-GaN shell. The ratio of the growth rate between the c- and m-planes on the NWs was calculated to be approximately 0.4545. High-angle annular dark-field scanning transmission electron microscopy characterization confirmed that no clear extended defects were present in the n-GaN core and MQS/p-GaN shells on the sidewall. Regarding the p-GaN shell above the c-plane MQS region, only a few screw dislocations and Frank-type partial dislocations appeared at the interface between the serpentine c-plane MQS and the p-GaN shell near the tips. This suggested that the crystalline quality of the MQS structure can trigger the formation of screw dislocations and Frank-type partial dislocations during the p-GaN growth. The growth mechanism of the p-GaN shell on NWs was also discussed. To inspect the electronic properties, a prototype of a micro light-emitting diode (LED) with a chip size of 50 × 50 μm2 was demonstrated in the NWs with optimal growth. By correlating the light output curve with the electroluminescence spectra, three different emission peaks (450, 470, and 510 nm) were assignable to the emission from the m-, r-, and c-planes, respectively.

Improving current injection into r- and m-planes of nanowires (NWs) is essential to realizing efficient GaInN/GaN multiple quantum shell (MQS) NW-based light-emitting diodes (LEDs). Here, we present the effects of different p-GaN shell growth conditions on the emission characteristics of MQS NW-LEDs. Firstly, a comparison between cathodoluminescence (CL) and electroluminescence (EL) spectra indicates that the emission in NW-LEDs originates from the top region of the NWs. By growing thick p-GaN shells, the variable emission peak at around 600 nm and degradation of the light output of the NW-LEDs are elaborated, which is attributable to the localization of current in the c-plane region with various In-rich clusters and deep-level defects. Utilizing a high growth rate of p-GaN shell, an increased r-plane and a reduced c-plane region promote the deposition of indium tin oxide layer over the entire NW. Therefore, the current is effectively injected into both the r- and m-planes of the NW structures. Consequently, the light output and EL peak intensity of the NW-LEDs are enhanced by factors of 4.3 and 13.8, respectively, under an injection current of 100 mA. Furthermore, scanning transmission electron microscope images demonstrate the suppression of dislocations, triangular defects, and stacking faults at the apex of the p-GaN shell with a high growth rate. Therefore, localization of current injection in nonradiative recombination centers near the c-plane was also inhibited. Our results emphasize the possibility of realizing high efficacy in NW-LEDs via optimal p-GaN shell growth conditions, which is quite promising for application in the long-wavelength region.

High crystalline quality coaxial GaInN/GaN multiple quantum shells (MQSs) grown on dislocation-free nanowires are highly in demand for efficient white-/micro-light-emitting diodes (LEDs). Here, we propose an effective approach to improve the MQS quality during the selective growth by metal-organic chemical vapor deposition. By increasing the growth temperature of GaN barriers, the cathodoluminescent intensity yielded enhancements of 0.7 and 3.9 times in the samples with GaN and AlGaN spacers, respectively. Using an AlGaN spacer before increasing the barrier temperature, the decomposition of GaInN quantum wells was suppressed on all planes, resulting in a high internal quantum efficiency up to 69%. As revealed by scanning transmission electron microscopy (STEM) characterization, the high barrier growth temperature allowed to achieve a clear interface between GaInN quantum wells and GaN quantum barriers on the c-, r-, and m-planes of the nanowires. Moreover, the correlation between the In incorporation and structure features in MQS was quantitatively assessed based on the STEM energy-dispersive X-ray spectroscopy mapping and line-scan profiles of In and Al fractions. Ultimately, it was demonstrated that the unintentional In incorporation in GaN barriers was induced by the evaporation of predeposited In-rich particles during low-temperature growth of GaInN wells. Such residual In contamination was sufficiently inhibited by inserting low Al fraction (∼6%) AlGaN spacers after each GaInN well. During the growth of AlGaN spacers, AlN polycrystalline particles were deposited on the surrounding dummy substrate, which suppressed the evaporation of the predeposited In-rich particles. Thus, the presence of AlGaN spacers certainly improved the uniformity of In fraction through five GaInN quantum wells and reduced the diffusion of point defects from n-core to MQS active structures. The superior coaxial GaInN/GaN MQS structures with the AlGaN spacer are supposed to improve the emission efficiency in white-/micro-LEDs.

The superior crystalline quality of coaxial GaInN/GaN multiple-quantum shell (MQS) nanowires (NWs) was demonstrated by employing an AlGaN undershell during metal-organic chemical vapor deposition. Scanning transmission electron microscopy (STEM) results reveal that the NW structure consists of distinct GaInN/GaN regions on different positions of the NWs and the cores were dislocation-free. High-resolution atomic contrast STEM images verified the importance of AlGaN undershells in trapping the point defects diffused from n-core to MQSs (m-planes), as well as the improvement of the grown crystal quality on the apex region (c-planes). Time-integrated and time-resolved photoluminescence (PL) measurements were performed to clarify the mechanism of the emission within the coaxial GaInN/GaN MQS NWs. The improved internal quantum efficiency in the NW sample was attributed to the unique AlGaN undershell, which was able to suppress the point defects diffusion and reduce the dislocation densities on c-planes. Carrier lifetimes of 2.19 ns and 8.44 ns were derived from time-resolved PL decay curves for NW samples without and with the AlGaN undershell, respectively. Hence, the use of an AlGaN undershell exhibits promising improvement of optical properties for NW-based white and micro light-emitting diodes.

Multi-color emission from coaxial GaInN/GaN multiple-quantum-shell (MQS) nanowire-based light-emitting diodes (LEDs) was identified. In this study, MQS nanowire samples for LED processes were selectively grown on patterned commercial GaN/sapphire substrates using metal–organic chemical vapor deposition. Three electroluminescence (EL) emission peaks (440, 540, and 630 nm) were observed, which were primarily attributed to the nonpolar m-planes, semipolar r-planes, and the polar c-plane tips of nanowire arrays. A modified epitaxial growth sequence with improved crystalline quality for MQSs was used to effectively narrow the EL emission peaks. Specifically, nanowire-based LEDs manifested a clear redshift from 430 nm to 520 nm upon insertion of AlGaN spacers after the growth of each GaInN quantum well. This demonstrates the feasibility of lengthening the EL emission wavelength since an AlGaN spacer can suppress In decomposition of the GaInN quantum wells during ramping up the growth temperature for GaN barriers. EL spectra showed stable emission peaks as a function of the injection current, verifying the critical feature of the non-polarization of GaN/GaInN MQSs on nanowires. In addition, by comparing EL and photoluminescence spectra, the yellow-red emission linked to the In-fluctuation and point defects in the c-plane MQS was verified by varying the activation annealing time and lowering the growth temperature of the GaInN quantum wells. Therefore, optimization of MQS nanowire growth with a high quality of c-planes is considered critical for improving the luminous efficiency of nanowire-based micro-LEDs/white LEDs.

GaInN/GaN multiple quantum shells (MQS) nanowires and p-GaN shells were embedded with n-GaN layers through tunnel junction (TJ) shells using metalorganic chemical vapor deposition (MOCVD) method. The MQS nanowires were selectively grown on n-GaN/sapphire or GaN substrates. The fabrication process of laser structures with different resonators of 600500, 750, 1000 μm, and cavity widths of 7, 12, and 17 μm were investigated with insulating layer on the sidewalls of the ridge. The structures of the fabricated devices were characterized by scanning electron microscope (SEM) and current-voltage-light output characteristics were evaluated. Two different methods for mirror formation, etching and cleavage, were developed for the laser devices. During the investigation, a superior mirror formation suffered from the difference in etching rate between GaInN and GaN, generating concaves in the MQS region. Bluegreen light emission was observed from the entire ridge surface of the MQS index-guided laser structures. A maximum current density of emission at 17.9 kA/cm2 has been confirmed in the devices. The electroluminescence and cathodoluminescence measurements demonstrated that the r-plane and c-plane at the top of the MQS are dominant at low current densities, and the m-plane emission becomes stronger as the current density increases.

A tunnel junction and a n-GaN cap layer grown on the multi-quantum shells (MQS) /nanowires are introduced to decrease the resistivity and optical loss. The selective-area growth of the MQS/nanowire core-shell structures on the template was performed by metalorganic vapour phase epitaxy (MOVPE). Further, the MQS structure was covered with the tunnel junction and the n-GaN cap layer. Here, the growth conditions of the n-GaN cap layer were systemically investigated. The effect of p-GaN shape on the morphology of grown n-GaN cap layer was also assessed.

The selective-monolithic growth of coaxial GaInN/GaN NWs was investigated by changing the TEG flow rate, barrier and well growth temperature during MQS growth. In incorporation increased with a higher TEG flow rate. However, In-rich flakes were formed the NWs resulting in the deterioration of crystal quality. Using a higher growth temperature of quantum barriers, abnormal growth at the top of NWs was eliminated. As a result, the CL emission intensity was enhanced. Furthermore, the occurrence of In desorption was suppressed by decreasing the growth temperature of quantum wells. Therefore, these results are promising for NW-based white LEDs.

Coaxial GaInN/GaN multiple-quantum-shells (MQSs) nanowires (NWs) were grown on an n-type GaN/sapphire template employing selective growth by metal-organic chemical vapour deposition (MOCVD). To improve the cathodoluminescence (CL) emission intensity, an AlGaN shell was grown underneath the MQS active structures. By controlling the growth temperature and duration, an impressive and up to 11-fold enhancement of CL intensity is achieved at the top area of the GaInN/GaN MQS NWs. The spatial distribution of Al composition in the AlGaN undershell was assessed as a function of position along the NW and analysed by energy-dispersive X-ray measurement and CL characterisation. By introducing an AlGaN shell underneath GaInN/GaN MQS, the diffusion of point defects from the n-core to MQS is effectively suppressed because of the lower formation energy of vacancies-complexes in AlGaN in comparison to GaN. Moreover, the spatial distribution of Al and In was attributed to the insufficient delivery of gas precursors to the bottom of the NWs and the anisotropy diffusion on the nonpolar m-planes. This investigation can shed light on the effect of the AlGaN undershell on improving the emission efficiency of NW-based white and micro-light-emitting diodes (LEDs).

In this study, the growth mechanisms of n-type gallium nitride (GaN) cap layers for embedding nanowire-based multi-quantum-shell (NW-MQS) with a tunnel junction were investigated using the metal–organic vapor-phase epitaxy method. Herein, instead of a p-type GaN layer, n-type GaN cap layers were applied as a contact layer to the anode electrode via a tunnel junction. NW-MQSs were prepared in a rectangular grid arrangement aligning with the m- and a-axis of GaN. The growth mode of the cap layers was controlled in three stages using different growth pressures and temperatures. The first cap layer was a faceted growth mode primarily comprising the r-plane, the second was a lateral growth mode that expanded the area of the c-plane, and the third was an acceleration of lateral growth. Finally, cap layers with a flat surface were realized. Void formation in the cap layers occurred only between the NW-MQSs along the m-axis of GaN. This observation can be attributed to the difference in the coalescence of the cap layers in the a- and m-axis directions. We believe that the NW-MQS structure with the cap layer that was optimized in this study can be used as a highly efficient optical device.

This study aimed to investigate and analyze the impurity doping characteristics in tunnel junctions (TJs) grown on core–shell structures, comprising GaInN/GaN multiple-quantum-shells (MQSs) and GaN nanowires. To this end, the impurity, structural, and electrical properties of the samples were characterized by scanning electron microscopy, scanning transmission electron microscopy, atom probe tomography (APT), nanoscale secondary ion mass spectrometry (NanoSIMS), and electroluminescence of the device which was fabricated for a prototype laser device to demonstrate an electrical operation of the MQSs layer. From the experimental results of NanoSIMS and APT, we demonstrated that the Mg-related problems in the TJ, such as the diffusion to the n++-GaN layer from the p+-GaN layer and formation of clusters in p+-GaN, are critical. Consequently, they cause a high operating voltage and dot-like spot emission of the light-emitting device. Based on the analysis, we suggested remedies and strategies to further improve the TJs that work well.

In this study, we discuss the influence of SiH4 flow rates on the structural and optical properties of GaN nanowires (NWs) with multiple-quantum-shells (MQSs). To this end, we prepared two n-GaN core NW samples with different SiH4 flow rates. Subsequently, MQS active layers of the same structure were grown on each n-GaN core NW under identical growth conditions. The samples were characterized by scanning electron microscopy, scanning transmission electron microscopy, energy-dispersive X-ray, and cathodoluminescence (CL) mapping. From the experimental results, we ascertained that a Si-rich layer was created between the sidewall of the NWs and MQSs, in which the number of Si atoms was mainly determined by the SiH4 flow rate. These Si atoms diffused into the MQSs during the growth, and significantly impacted the structural and optical properties, such as the shape and crystalline quality of the MQSs and NWs, and the CL intensity of the MQSs. On the basis of experimental results, we conclude that the SiH4 flow rate during the NW growth plays a critical role in the performance of an MQS-based optoelectronic semiconductor device.

Tunable emission wavelengths from 415 nm to 600 nm were demonstrated in coaxial GaInN/GaN multiple quantum shells (MQS) grown on three-dimensional nanostructures. Uniform aperture arrays with different diameters and pitches were patterned on GaN/sapphire substrates by nanoimprint and e-beam lithography. Thereafter, the coaxial GaInN/GaN MQS structures were selectively grown on the nanostructures using metalorganic chemical vapor deposition (MOCVD). To achieve long wavelength emissions, a detailed investigation in terms of height, filling factor, diameter of apertures, and pitch was performed for clarifying the In incorporation in nanostructures. Scanning transmission electron microscopy (STEM) features demonstrate that the diffusion of precursors on SiO2 mask area plays an important role in the coaxially growth of MQS structures on naonopyramids. A growth model based on the diffusion length and pitch was proposed to explain the experimental results. It was clarified that the probability of In incorporation was promoted in nanopyramids with a small pitch (less than 3 times of the diffusion length), wherein direct impinged adatoms on nanopyramids also diffused and participated in the growth on the neighbor. With a decrease in the intervals of aperture patterns, emission longer than 600 nm can be achieved for white and micro light-emitting diodes.

Broadened emission was demonstrated in coaxial GaInN/GaN multiple quantum shell (MQS) nanowires that were monolithically grown by metalorganic chemical vapor deposition. The non-polar GaInN/GaN structures were coaxially grown on n-core nanowires with combinations of three different diameters and pitches. To broaden the emission band in these three nanowire patterns, we varied the triethylgallium (TEG) flow rate and the growth temperature of the quantum barriers and wells, and investigated their effects on the In incorporation rate during MQS growth. At higher TEG flow rates, the growth rate of MQS and the In incorporation rate were promoted, resulting in slightly higher cathodoluminescence (CL) intensity. An enhancement up to 2&ndash, 3 times of CL intensity was observed by escalating the growth temperature of the quantum barriers to 800 &deg, C. Furthermore, decreasing the growth temperature of the quantum wells redshifted the peak wavelength without reducing the MQS quality. Under the modified growth sequence, monolithically grown nanowires with a broaden emission was achieved. Moreover, it verified that reducing the filling factor (pitch) can further promote the In incorporation probability on the nanowires. Compared with the conventional film-based quantum well LEDs, the demonstrated monolithic coaxial GaInN/GaN nanowires are promising candidates for phosphor-free white and micro light-emitting diodes (LEDs).

Nonpolar GaInN/GaN multiple-quantum shells (MQSs) on nanowires (NWs) were investigated for high-efficiency light-emitting diodes (LEDs). The growth conditions of NWs were systematically optimized via a continuous growth mode in metal-organic chemical vapour deposition (MOCVD). The In incorporation rate on the m-planes decreased as the growth temperature elaborated, whereas the crystalline quality is improved. The cathodoluminescence (CL) results revealed that longer growth time of the GaInN well can induce additional In-rich droplets and degrade the emission properties of MQSs. The CL emission intensity and the peak wavelength increased as the number of MQS pairs increased from one to three pairs, which was attributed to the increased In incorporation as the diameter enhanced. The linearly enhanced CL emission intensity with barrier thickness was ascribed to the increase of the electron-hole states from the GaN barrier to the wells, resulting in a larger recombination probability. The scanning transmission electron microscopy (STEM) results demonstrated that a thicker barrier shell can suppress the formation of In-rich droplets. Overall, the feasibility of obtaining high-quality m-plane coaxial GaInN/GaN MQSs structures are promising for NW-based white and micro LEDs.