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In a switchgear, an external transverse magnetic field (ETMF) is generated by the U type loop consisting of the vacuum interrupter, external busbar and conductive rod connected to the vacuum interrupter. The ETMF will make the vacuum arc deflected and strengthen the contraction of the arc. This can increase the probability of breaking failure. To weaken the adverse effect of the ETMF, the real magnetic field data of the arc area with different structure parameters when the length of conductive rod, external busbar and phase distance is changed are obtained by establishing simulation model in this paper. Taking the real magnetic field data as the boundary condition, this paper obtains the typical parameters of the vacuum arc plasma with different structure parameters by using the established three-dimensional high-current vacuum arc magnetohydrodynamics model. The simulation results show that the ETMF makes the transverse magnetic field (TMF) of the arc area asymmetric, which leads to an arc deflection. Reducing the length of the conductive rod connected to the vacuum interrupter to 50 mm can effectively improve the asymmetry of the TMF caused by the EMTF, weaken the arc deflection phenomenon, make the distribution of the plasma parameters more uniform, and increases the utilization of the anode contact surface. Moreover, it can not only reduce the heat flux density into the anode as a whole, but also reduce the heat flux density in the high heat flux density area, so as to effectively reduce the degree of anode activity and improve the negative effects caused by the anode activity. The changes of other external structural parameters have less influence on the improvement of the vacuum arc deflection phenomenon. Increasing the phase spacing to 275 mm or reducing the length of the external bus bar to 100 mm can only slightly weaken the arc deflection. [ABSTRACT FROM AUTHOR]

When short current is interrupted in three-phase vacuum interrupter in switchgear, the “U”-type loop composed of external busbar, conductive rod, and vacuum interrupter, and its adjacent phases will generate external actual transverse magnetic field (EATMF) in the interrupter. The existence of EATMF will deflect the vacuum arc, which will affect the breaking performance of vacuum switch. In view of this situation, this article establishes two kinds of electrode system simulation models considering and not considering EATMF. The simulation results show that EATMF is not uniformly distributed in the interelectrode region, but is stronger in the contact cup edge area outside the “U”-type loop, weaker in the “U”-type loop, and mainly affects ${B} _{x}$. In different short-circuit cases, EATMF is also different due to the difference of phase distance and short current. In the case of three-phase short circuit, the magnetic field in the interelectrode region of the middle phase is most significantly affected by EATMF. EATMF is closely related to the structure size of vacuum switch. By changing the structure size of vacuum switch (e.g., phase spacing ${d}$ , conductive rod length ${h} _{1}$ , ${h} _{2}$), EATMF can be weakened to some extent. [ABSTRACT FROM AUTHOR]