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In this Letter, we report the demonstration of zinc ion-implantation to realize planar mid-wavelength infrared photodetectors based on type-II InAs/InAs1−xSbx superlattices. At 77 K, the photodetectors exhibit a peak responsivity of 0.68 A/W at 3.35 μm, corresponding to a quantum efficiency of 23.5% under Vb = −80 mV, without anti-reflection coating; these photodetectors have a 100% cutoff wavelength of 4.28 μm. With an R0 × A value of 1.53 × 104 Ω cm2 and a dark current density of 1.23 × 10−6 A/cm2 under an applied bias of −80 mV at 77 K, the photodetectors exhibit a specific detectivity of 9.12 × 1011 cm·Hz1/2/W. [ABSTRACT FROM AUTHOR]

We report a Zn-diffused planar mid-wavelength infrared photodetector based on type-II InAs/InAs1−xSbx superlattices. Both the superlattice growth and Zn diffusion were performed in a metal-organic chemical vapor deposition system. At 77 K, the photodetector exhibits a peak responsivity of 0.70 A/W at 3.65 μm, corresponding to a quantum efficiency of 24% at zero bias without anti-reflection coating, with a 50% cutoff wavelength of 4.28 μm. With an R0A value of 3.2 × 105 Ω cm2 and a dark current density of 9.6 × 10−8 A/cm2 under an applied bias of −20 mV at 77 K, the photodetector exhibits a specific detectivity of 2.9 × 1012 cm Hz1/2/W. At 150 K, the photodetector exhibits a dark current density of 9.1 × 10−6 A/cm2 and a quantum efficiency of 25%, resulting in a detectivity of 3.4 × 1011 cm Hz1/2/W. [ABSTRACT FROM AUTHOR]

A high operating temperature mid-wavelength infrared pBn photodetector based on the type-II InAs/InAsSb superlattice on a GaSb substrate has been demonstrated. At 150 K, the photodetector exhibits a peak responsivity of 1.48 A/W, corresponding to a quantum efficiency of 47% at −50 mV applied bias under front-side illumination, with a 50% cutoff wavelength of 4.4 µm. With an R × A of 12 783 Ω cm2 and a dark current density of 1.16 × 10−5 A/cm2 under −50 mV applied bias, the photodetector exhibits a specific detectivity of 7.1 × 1011 cm Hz1/2/W. At 300 K, the photodetector exhibits a dark current density of 0.44 A/cm2 and a quantum efficiency of 39%, resulting in a specific detectivity of 2.5 × 109 cm Hz1/2/W. [ABSTRACT FROM AUTHOR]

We report design, growth, and characterization of midwavelength infrared nBn photodetectors based on a type-II InAs/InAs1-xSbx superlattice on a GaSb substrate grown by metal-organic chemical vapor deposition. An InAs/AlAs1-ySby/InAs/InAs1-xSbx superlattice design was used as the large bandgap electron barrier in the photodetectors. At 150 K, the photodetector exhibits a peak responsivity of 1.23 A/W, corresponding to a quantum efficiency of 41% at an applied bias voltage of −100 mV under front-side illumination, with a 50% cut-off wavelength of 4.6 μm. With an R × A of 356 Ω cm2 and a dark current density of 1.6 × 10−4 A/cm2 under an applied bias of −100 mV at 150 K, the photodetector exhibits a specific detectivity of 1.4 × 1011 cm Hz1/2/W. [ABSTRACT FROM AUTHOR]

By introducing a double barrier design, a high performance InAs/InAsSb type-II superlattice mid-wavelength infrared photodetector has been demonstrated. The photodetector exhibits a cut-off wavelength of ~4.50 µm at 150 K. At 150 K and −120 mV applied bias, the photodetector exhibits a dark current density of 1.21 × 10−5 A/cm2, a quantum efficiency of 45% at peak responsivity (~3.95 µm), and a specific detectivity of 6.9 × 1011 cm·Hz1/2/W. The photodetector shows background-limited operating temperature up to 160 K. [ABSTRACT FROM AUTHOR]

In this letter, we report the demonstration of a pBn planar mid-wavelength infrared photodetectors based on type-II InAs/InAs1−xSbx superlattices, using silicon ion-implantation to isolate the devices. At 77 K the photodetectors exhibited peak responsivity of 0.76 A/W at 3.8 µm, corresponding to a quantum efficiency, without anti-reflection coating, of 21.5% under an applied bias of +40 mV with a 100% cut-off wavelength of 4.6 µm. With a dark current density of 5.21 × 10−6 A/cm2, under +40 mV applied bias and at 77 K, the photodetector exhibited a specific detectivity of 4.95 × 1011 cm·Hz1/2/W. [ABSTRACT FROM AUTHOR]

• We have manufactured a SWIR detector and characterized its photoelectric performance in detail. • We calculated the carrier lifetime and dark current activation energy of the device, and found that dark current limits its application at high temperatures. This study investigates the performance of infrared photodetectors through variable temperature tests, specifically examining dark current, light current, and capacitance. The reduction of dark current and the increase in carrier lifetimes are crucial for enabling the utilization of infrared photodetectors in complex environments. By conducting tests and analyses on high-performance detectors, the physical mechanisms governing carrier transport processes can be obtained. In order to elucidate the characteristics of InAs/GaSb/AlSb type-II superlattices, a short-wave infrared (SWIR) photodetector exhibiting low dark current and low saturation bias voltage is designed and fabricated. [ABSTRACT FROM AUTHOR]

• High-speed T2SLs based heterojunction phototransistors have been demonstrated. • The influence of different parameters on device performance has been investigated. • The trade-off between the high-speed performance and optical gain has been showed. In this study, high speed performance of heterojunction phototransistors (HPTs) based on InAs/GaSb/AlSb type-II superlattice with 30 nm base thickness and 50% cut-off wavelength of 2.0 μm at room temperature are demonstrated. We studied the relationship between −3 dB cut-off frequency of these HPT versus mesa size, applied bias, and collector layer thickness. For 8 μm diameter circular mesas HPT devices with a 0.5 μm collector layer, under 20 V applied bias voltage, we achieved a −3 dB cut-off frequency of 2.8 GHz. [ABSTRACT FROM AUTHOR]

• A novel short-wavelength dual-band photodetector based on AlInAsSb digital alloy. • The near-infrared sub-detector achieves high responsivity via impact ionization. • Three-terminal architecture ensures complete electrical isolation. We have demonstrated a monolithic and optically-aligned short-wavelength (SW) dual-band photodetector with Al 0.6 In 0.4 AsSb/Al 0.3 In 0.7 AsSb (APD/SW) back-to-back p - i - n / n - i - p structures on GaSb substrate. The three-terminal architecture was used to ensure complete electrical isolation of the two sub-detectors at operating bias and to enable simultaneous detection and output of the APD signal and SW signal. Low optical crosstalk (<-10 dB) between the two sub-detectors is achieved for the 1095–1185 nm range. At 300 K, the APD sub-detector has a unity gain responsivity of 0.237A/W, at −1 V, and a specific detectivity of 2.64 × 1011 cm·Hz1/2/W at 1035 nm. At a reverse bias voltage of 40.8 V, the APD sub-detector achieves a maximum responsivity is 3.594 A/W of 1064 nm and 2.098 A/W of 635 nm. Meanwhile, the SW sub-detector under −1V has a responsivity of 0.424 A/W, and a specific detectivity of 2.78 × 1010 cm·Hz1/2/W at 1723 nm. [ABSTRACT FROM AUTHOR]

Mid-wavelength infrared InAs/InAsSb type-II superlattice p+-B-n photodetectors are demonstrated. An AlAsSb/InAsSb superlattice barrier structure is introduced in order to reduce the bias dependency of optical efficiency. The photodetector exhibits a cut-off wavelength of ∼5.0 µm at 150 K. At 150 K and −100 mV applied bias, the photodetector exhibits a dark current density of 1.2 × 10-4 A/cm2, a quantum efficiency of 29% at peak responsivity (∼4.1 µm), and a specific detectivity of 1.2 × 1011 cm•Hz1/2/W. [ABSTRACT FROM AUTHOR]