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We present results of a combined two-photon photoemission and scanning electron microscopy investigation to determine the electromagnetic enhancement factors of silver-coated spherical nanoparticles deposited on an atomically flat mica substrate. Femtosecond laser excitation of the nanoparticles produces intense photoemission, attributed to near-resonant excitation of localized surface plasmons. Enhancement factors are determined by comparing the respective two-photon photoemission yields measured for single nanoparticles and the surrounding flat surface. For p-polarized, 400 nm (∼3.1 eV) femtosecond radiation, a distribution of enhancement factors is found with a large percentage (67%) of the nanoparticles falling within a median range. A correlated scanning electron microscopy analysis demonstrated that the nanoparticles typifying the median of the distribution are characterized by spherical shapes and relatively smooth silver film morphologies. In contrast, the largest enhancement factors were produced by a small percentage (7%) of particles that displayed silver coating defects that altered the overall particle structure. Comparisons are made between the experimentally measured enhancement factors and previously reported calculations of the localized near-field enhancement for isolated silver nanoparticles. [ABSTRACT FROM AUTHOR]

Phase transformation of thin film (∼30 nm)In2Se3/Si(111) (amorphous→crystalline) was performed by resistive annealing and the reverse transformation (crystalline→amorphous) was performed by nanosecond laser annealing. As an intrinsic-vacancy, binary chalcogenide semiconductor, In2Se3 is of interest for non-volatile phase-change memory. Amorphous In x Se y was deposited at room temperature on Si(111) after pre-deposition of a crystalline In2Se3 buffer layer (0.64 nm). Upon resistive annealing to 380°C, the film was transformed into a γ-In2Se3 single crystal with its {0001} planes parallel to the Si(111) substrate and $(11\bar{2}0)$ parallel to Si $(1\bar{1}0)$ , as evidenced by scanning tunneling microscopy, low energy electron diffraction, and X-ray diffraction. Laser annealing with 20-ns pulses (0.1 millijoules/pulse, fluence≤50 mJ/cm2) re-amorphized the region exposed to the laser beam, as observed with photoemission electron microscopy (PEEM). The amorphous phase in PEEM appears dark, likely due to abundant defect levels inhibiting electron emission from the amorphous In x Se y film. [ABSTRACT FROM AUTHOR]

Photoemission electron microscopy is used to study copper diffusion through a ruthenium thin film. The photoemission electron microscopy images display a large contrast between Cu and Ru due to the differences in work function, making photoemission electron microscopy an ideal methodology to study thin film diffusion in real time. Between 175 and 290 °C, Cu mainly diffuses through defect sites in the thin Ru film. Uniform diffusion of Cu through the Ru film begins at approximately 300 °C. The results are confirmed by x-ray photoemission spectroscopy depth profiling and scanning electron microscopy–energy dispersive x-ray spectroscopy analysis. [ABSTRACT FROM AUTHOR]

We use photoemission electron microscopy (PEEM) to image 3 μm diameter polystyrene spheres supported on a metal thin film illuminated by 400 nm (∼3.1 eV) and 800 nm (∼1.5 eV) femtosecond (fs) laser pulses. Intense photoemission is generated by microspheres even though polystyrene is an insulator and its ionization threshold is well above the photon energies employed. We observe intense photoemission from the far side (the side opposite the incident light) of the illuminated microsphere that is attributed to light focusing within the microsphere. For the case of p-polarized, 800 nm fs laser pulses, we observe photoemission exclusively from the far side of the microsphere and additionally resolve sub-50 nm hot spots in the supporting Pt/Pd thin film that are located only within the focal region of the microsphere. We compare the PEEM images with finite difference time domain (FDTD) electrodynamic simulations to model our experimental results. The FDTD simulations predict light focusing in the microsphere and subsequent interaction with the supporting metal surface that is consistent with the experimental observations. [ABSTRACT FROM AUTHOR]