Search

For surface electronic state analyses of metals, we developed a new x-ray-absorption fine structure (XAFS) measurement technique with a parallel-plate capacitor. Since the capacitance is changed by x-ray-induced photoionization on the metal surface, the surface XAFS spectrum of a metal can be obtained from the capacitance dependent on the x-ray photon energy. We adopted this technique to the Cu metals. The XAFS spectrum at the Cu K absorption edge is different from the conventional XAFS spectrum of either Cu or Cu2O. This finding suggests that the XAFS spectrum indicates two-dimensional (2D) electronic states between the Cu bulk and the Cu2O native oxide layer. The 2D electronic states were characterized by degeneration of Cu 4pπ and a blueshift of Cu 4pσ. These characteristics can be explained by hybridization of vertical Cu 4pz with horizontal 4px and 4py in CuO-like structure at the interface. [ABSTRACT FROM AUTHOR]

Valence photoelectron spectra of an electron-beam (EB) irradiated C60 film, which exhibited metallic electron-transport properties in air at room temperature, are presented. The electronic structure of the C60 film became closer to that of graphite as the EB-irradiation time increased, and its density of states around the Fermi level was eventually greater than for the graphite. This suggests that the electronic structure of the C60 film changed from a semiconductor to a semimetal and/or metal by EB irradiation. Interestingly, the electronic structure remained metallic even after five days of air exposure, which is the reason for the metallic electron-transport property in our previous report [Appl. Phys. Lett. 82, 595 (2003)]. [ABSTRACT FROM AUTHOR]