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Alternating current poling (ACP) was performed on Gen III relaxor-PT Mn-doped Pb(In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3 (Mn: PIN-PMN-PT) single crystals with the poling direction of [001]. Experimental results proved that ACP could bring property enhancement to both k31 and k33 mode crystals. Compared to those from traditional direct current poling (DCP), ACP with the optimized conditions (20 kV/cm, 0.1 Hz, and 20 cycles) enhanced the dielectric and piezoelectric properties of k31-mode mode crystals by more than 30%, where the enhanced free dielectric constant and piezoelectric coefficient d33 reached 5300 and 1750 pC/N, respectively. Furthermore, replacing DCP with ACP could increase the advantages of Gen III relaxor-PT. The coupling factors k31 and k33 were enhanced to 0.472 and 0.915, the mechanical quality factor Qm was enhanced by 17%, and the depoling temperature was raised by 17 °C to 123 °C. In the following mechanism study, in situ x-ray diffraction (XRD) combined with the temperature-dependent dielectric constant measurement proved the introduction of the monoclinic phases after ACP, while piezoresponse force microscopy (PFM) observation showed "2R"-like "2M" domain morphologies in ACP single crystals. Both these intrinsic and extrinsic factors are believed to be the keys to the mechanisms of property enhancement behind ACP. This study proved that ACP is an effective property enhancement method suitable for Gen III relaxor-PT single crystals and will promote its applications in high-temperature and high-power devices. [ABSTRACT FROM AUTHOR]

(1- x)Pb(Mg 1/3 Nb 2/3)O 3 - x PbTiO 3 (PMN-PT) single crystals, especially with compositions near its morphotropic phase boundary (MPB), have been employed for a broad range of applications such as ultrasound transducers, sensors, and actuators. To further enhance the properties of PMN-PT, electrode patterning, as a method of domain engineering, was proved to be an effective approach. In our previous report, a 200 nm grating pattern electrode (Ti/Au–MnO x) (nano-electrode) was prepared on one surface of PMN-PT crystal, exhibiting 30% d 33 enhancement. In this work, the multi-layered domain morphology and the domain engineering from nano-electrode were characterized using piezoresponse force microscopy (PFM). A hypothetical domain engineering model for nano-electrodes is established to explain the experimental results as well as the property enhancement from the nano-electrode. The electrode patterning proves that the nano-scale modification can tune the macro-scale piezoelectric properties of the bulk material. Image, graphical abstract Nano-patterned composite electrode (Nano-electrode) , as a method of domain engineering, exhibits 30% d 33 enhancement on (1- x)Pb(Mg 1/3 Nb 2/3)O 3 - x PbTiO 3 (PMN-PT) single crystal. In this work, the mechanism of the property enhancement is studied through the multi-layered domain morphology by piezoresponse force microscopy (PFM). A hypothetical domain engineering model for nano-electrodes is established in the end. [ABSTRACT FROM AUTHOR]

In this paper, 0.7Pb(Mg1/3Nb2/3)O3-0.3PbTiO3 (PMN-30%PT) single crystal samples were poled using an alternating current (electric field) poling (ACP) method. Compared to the traditional poling method, the piezoelectric coefficient, free and clamped dielectric constants were improved more than 21%. X-ray diffraction result suggests the existence of monoclinic phase (MA) in ACP samples and piezoresponse force microscopy (PFM) result further depicts the finer engineered domain structures. The ACP sample also showed the unique phase transition sequences during the depoling process. Our work could provide a novel domain engineered method to enhance piezoelectric properties of PMN-PT single crystal. Piezoelectric and dielectric properties of relaxor-PT single crystals can be significantly enhanced by employing the new alternating current poling method, attributing to the unique heterogenous domain structure containing unprecedented domain wall density. [ABSTRACT FROM AUTHOR]

Sliver-mode 0.73Pb(Mg 1/3 Nb 2/3)O 3 -0.27PbTiO 3 single crystals were poled by the alternating current electric field (ACP) along the [001] direction for low-frequency transducer applications. Under ACP with optimized conditions (2.89 kV rms , 0.1 Hz, 10 cycles), the free dielectric constant (ε T 33 / ε 0) was enhanced from 5300 to 7220 and piezoelectric coefficient (d 33) was improved from 1410 to 1920 pC/N, both are about 36% higher than those under traditional direct current poling. The piezoresponse force microscopy observation and phase-field simulation show the similar domain morphologies evolution. During the ACP process, the domain morphology first changes from '4R' to '2R' configuration, and then the length of the 109° domain wall keeps increasing, which leads to a longer range of ordering and a stable lamellar domain structure in the end. The correlation between the domain morphology and the coercive field is also found in both the experiment and simulation. These findings on the effect and mechanism of ACP will help develop advanced low-frequency single crystal transducer arrays. Evolution of domain structures of rhombohedral PMN-PT during ACP process was studied through the domain morphology tracking, which developed from '4R' to '2R' configuration. The results also show a good correlation between coercive field and domain structure, attributing to a new domain engineering model. [Display omitted] [ABSTRACT FROM AUTHOR]