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Your search keyword '"Runger, George C."' showing total 8 results

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1. Generalized Linear Model-based Control Charts for Discrete Semiconductor Process Data.

2. Multivariate Extensions to Cumulative Sum Control Charts.

3. Process monitoring for correlated gamma-distributed data using generalized-linear-model-based control charts.

4. Robustness properties of multivariate EWMA control charts.

5. Performance of customized control charts to detect process disturbances.

6. Statistically constrained economic design of the multivariate exponentially weighted moving average control chart.

7. Improving the performance of the multivariate exponentially weighted moving average control chart.

8. Selection of the subgroup size and sampling interval for a CUSUM control chart.

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