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The potential fluctuations in III-nitride quantum wells lead to many effects like emission broadening and S-shape energy vs. temperature dependence. The best description of the energy dependence comes from calculations based on Gaussian density of states. However, in most of the published reports, changes of carrier lifetime with energy and temperature are not taken into account. Since experimental evidence shows that lifetime significantly depends on energy and temperature, here we propose a model that describes two basic parameters of luminescence: lifetime of carries and emission energy as a function of temperature in the case of quantum wells and layers that are characterized by potential fluctuations. Comparison of the measured energy and lifetime dependences on temperature in specially grown InGaN/GaN quantum wells and InAlGaN layer shows very good agreement with the proposed theoretical approach.

Growth of high-quality nitride-based structures requires use of miscut substrates, which means that the growth plane is tilted with respect to the c lattice plane (0001). In order to investigate the miscut influence on grown layers, patterned GaN substrates with separate regions tilted between 0.34° and 0.97° to the c-plane were used to grow multiquantum well InGaN/GaN structures by metalorganic vapor phase epitaxy. The quantum wells had a nominal 6% indium content. Precise values of miscut in each region were determined by atomic-force microscopy. Recombination dynamics in each region was studied using time-resolved microphotoluminescence (PL) from 4 K to room temperature. It was found that the PL energy increases with miscut angle from 3.17 to 3.29 eV (at 4 K). The PL lifetime also correlated with the miscut angle, it decreased from 1.2 down to 0.8 ns (at 4 K). These results suggest that an increase of the angle causes a decrease of the indium content. Less indium naturally leads to a higher bandgap, and to reduction of electric field inside the quantum wells (QWs). Both effects lead to a PL energy increase. Moreover, the decrease of the electric field reduces the electron–hole separation that explains the shorter radiative recombination at 4 K at regions of high-miscut angles. The shape of temperature dependence of PL decay times suggests that at low temperatures PL decay is determined by the localization of carriers, whereas in room temperature LO phonon-assisted delocalization processes play a dominant role.

We describe surface patterning as a method to obtain discrete regions of different local miscut angles, δ, in semipolar ( 20 2 ¯ 1 ) GaN substrates. During patterning the region angle δ was varied between 0° and ±2° with respect to the growth plane. We chose two nonequivalent miscut directions: a 〈 1 ¯ 2 1 ¯ 0 〉 and c ׳ 〈 1 ¯ 01 4 ¯ 〉. On such patterned substrates In x Ga 1− x N/GaN quantum wells were grown by a Metalorganic Vapor Phase Epitaxy method. Angled regions were not planarized during growth and their initial miscut angles remained. We studied structural, morphological and optical properties of In x Ga 1− x N/GaN quantum wells as a function of δ . The intended In concentration, x , was about 13% on exact oriented ( 20 2 ¯ 1 ) planes. For miscut towards the a -direction, indium content decreases and luminescence energy increases with δ . For miscut towards c ׳, we observe quite different behaviors, indium content and quantum well width are constant and luminescence energy increases with δ . We propose the explanation of these effects on the basis of sample morphology, In-content and built-in electric field. The obtained results are important for understanding the role of miscut (intentional and unintentional) in basic properties of semipolar InGaN/GaN quantum well structures. It is also worth to note that, the spectral width of luminescence was the smallest for regions miscut 2° towards c ׳ direction, which can be important for semipolar optoelectronic devices.

International audience; The dependence on exciton density of the interwell coupling scheme in a series of InGaN/GaN symmetrical double quantum wells (DQWs) with varying central barrier width was observed. Continuous-wave photolu-minescence (cw-PL) and time-resolved photoluminescence (TRPL), measured at low temperature (6-13 K), allowed us to examine the competition between three optical recombination channels, namely, the recombination of (i) intrawell excitons (DXs), (ii) interwell indirect excitons (IXs), and (iii) presumably coupled well excitons (CWXs), built of electron and hole wave functions that are widely spread over the entire DQW structure. We demonstrate a rather abrupt switching effect that relies on the actual exciton density in the system. In cw-PL experiments as a function of the pumping laser power, this switching is characterized by a threshold laser power density above which we observe (i) a significant change of slope of both the power-dependent blueshift and intensity of the ground-state exciton and (ii) the appearance of higher-energy optical emissions. In TRPL, as the PL intensity decays with time, both these effects are visible but in opposite direction, including the PL intensity transfer from the higher-energy state to the ground state. The observed switching is assigned to a change of the dominant excitonic recombination regime: at low pumping densities the dominant emission arises from the extremely long-lived IX, whereas above threshold the dominant emission corresponds to DXs or CWXs, depending on the barrier width. The threshold power density (or threshold time for TRPL) presents a clearly exponential dependence upon the width of the central barrier, which demonstrates the role of carrier tunneling in the overall switching process. The comparison of IXs in nitride QWs with bias electric-field induced IXs in GaAs/AlGaAs DQWs shows that the spectral blueshifts are a few times larger in the former structures. This enhancement originates from the built-in electric field in group-III nitrides, which has truly microscopic character. Moreover, it is argued that the presence of the potential fluctuations due to alloy disorder and the fluctuations of the coupling barrier width have only a secondary effect on the observed switching.

The horizontal excitation energy transport in the range of tens of micrometers was measured in high quality homoepitaxial InGaN quantum wells (QWs) with the use of time and space resolved micro-photoluminescence as a function of (i) applied vertical electric field, (ii) temperature, and (iii) linear density of atomic steps. The investigated structure consisted of InGaN QWs inside a p-n junction. The indium content in QWs was designed to be different in defined areas of the sample (due to mastering of different off-cuts and atomic steps density) so that the wells could emit at energies from 2.6 to 2.86 eV. The horizontal transport range was sensitive to the vertical electric field, which means that it could not be just a radiation transfer, but charge carriers must have been involved as well. We found that the transport range decreased for higher slope angles, possibly due to stronger scattering on atomic steps when their linear density became higher. The diffusion coefficients reached 6 cm2/s and due to long lifetime of even 2 μs, the diffusion length was even LD = 30 μm in areas of low off-cut angles. We discuss possible mechanisms of transport and conclude that for such high diffusion constant, the most probable is the excitonic transport. The LD was maximum at 40 K and then decreased significantly with temperature, which was probably caused by thermal dissociation of excitons.