1. Photoluminescence and photoreflectance characterization of ZnxCd1-xSe/MgSe multiple quantum wells.
- Author
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Wu, J. D., Huang, Y. S., Li, B. S., Shen, A., Tamargo, M. C., and Tiong, K. K.
- Subjects
PHOTOLUMINESCENCE ,ZINC compounds ,QUANTUM wells ,MOLECULAR beam epitaxy ,MOLECULAR beams - Abstract
Photoluminescence (PL) and photoreflectance (PR) were used to characterize Zn
x Cd1-x Se/MgSe multiple quantum well (MQW) structures grown on InP substrates by molecular beam epitaxy for mid-infrared (IR) device applications. The PL spectra yielded information of the fundamental excitonic recombination and Znx Cd1-x Se cap/spacer band edge emission of the samples. The PR spectra revealed multitude of possible interband transitions in MQW structures. The ground state transitions were assigned by comparing with the PL emission signals taken from the same structures. A comprehensive analysis of the PR spectra led to the identification of various interband transitions. The intersubband transitions were then estimated and found to be in a good agreement with the previous report of Fourier-transform IR absorption measurements [Li et al., Appl. Phys. Lett. 92, 261104 (2008)]. The results demonstrate the potential of using PL and PR as nondestructive optical techniques for characterization of Znx Cd1-x Se/MgSe MQWs for mid-IR device applications. [ABSTRACT FROM AUTHOR]- Published
- 2010
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