1. Raman, complex chemical bond and structural studies of novel CaMg1-x(Mn1/2Zn1/2)xSi2O6 (x=0-0.1) ceramics.
- Author
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Li, Hao, Cai, Chaoyang, Xiang, Qiuyuan, Tang, Bin, Yu, Shengquan, xiao, Jing, Luo, Heng, and Zhang, Shuren
- Subjects
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DIELECTRIC properties , *CHEMICAL bonds , *VALENCE bonds , *CERAMICS , *RAMAN spectroscopy , *RIETVELD refinement , *PERMITTIVITY - Abstract
Low permittivity CaMg 1- x (Mn 1/2 Zn 1/2) x Si 2 O 6 (x = 0-0.1) ceramics were synthesized via the solid-state reaction process for the first time. The Rietveld refinement, complex chemical bond theory and Raman spectra were introduced to analyze the effects of Mn2+/Zn2+ co-substitution to microwave dielectric properties. XRD spectra indicate the CaMg 1- x (Mn 1/2 Zn 1/2) x Si 2 O 6 ceramics processed the pure phase of CaMgSi 2 O 6 when x ≤ 0.02 and a small volume of secondary phase Ca 2 MgSi 2 O 7 for 0.04 ≤ x ≤ 0.1. The variation of ε r can be put down to average bond iconicity and Raman shift. Total lattice energy and packing fraction are main influence factor of the Q × f value. The monotonous decrease of τ f is associated with total bond valence and full width at half maximum of Raman peak. Additionally, CaMg 1- x (Mn 1/2 Zn 1/2) x Si 2 O 6 (x = 0.02) ceramics sintered at 1280 °C for 3 h exhibited excellent microwave dielectric properties of ε r = 8.16, Q × f = 70187, τ f = −38.48 ppm/°C. [ABSTRACT FROM AUTHOR]
- Published
- 2019
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