1. Reliability assessment models for competing failure processes with two types of correlative thresholds.
- Author
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Song, Qingbiao, Tang, Jiayin, Wei, Honglei, and Li, Yong
- Subjects
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MICROELECTROMECHANICAL systems , *COMPETING risks , *RELIABILITY in engineering , *SENSITIVITY analysis - Abstract
The two dependent competing risks are soft failure due to aging degradation and fragmentation caused by shocks and hard failure due to spring breakage caused by the same shock process. Considering the complexity of the product itself and the instability of the working environment, this study proposed a generalized reliability model for systems experiencing dependent competing failure processes (DCFPs) of degradation and random shocks, which considered two kinds of DCFP: (1) shock process could affect soft failure thresholds; (2) degradation process could affect hard failure thresholds. In case (1), we considered the effect that a cumulative number of shocks above a certain magnitude could have on the change in the soft failure threshold. In case (2), we considered not only the shock process's impact on the soft failure threshold but also the total degradation (including continuous degradation and sudden degradation caused by shock) on the hard failure threshold. The model captures the features that the shocks experienced by the system affect the degradation process, accelerating the system degradation and causing soft failures; the degradation process of the system affects the shock process, making the system more susceptible to failure from external shocks. Finally, an example using micro‐electro‐mechanical systems devices illustrates the effectiveness of the proposed approach with sensitivity analysis. [ABSTRACT FROM AUTHOR]
- Published
- 2024
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