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We report on the accurate measurement of nonlinear ellipse rotation (NER) by means of a phase-sensitive method employing a dual-phase lock-in. The magnitudes and signs of pure refractive electronic nonlinearities of silica and BK7 were determined with this new method using 150 femtosecond (fs) laser pulses at 775 nm. Experimental and theoretical analyses of the NER signal were carried out and the results were compared to those obtained with the Z-scan technique.