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Your search keyword '"Buchner, S. P."' showing total 3 results
Start Over Author "Buchner, S. P." Topic single event transient
3 results on '"Buchner, S. P."'

1. Modeling and Investigations on TID-ASETs Synergistic Effect in LM124 Operational Amplifier From Three Different Manufacturers.

Author

Roig, Fabien, Dusseau, L., Khachatrian, A., Roche, N. J-H., Privat, A., Vaille, J.-R., Boch, J., Warner, J. H., Saigne, F., Buchner, S. P., McMorrow, D., Ribeiro, P., Auriel, G., Azais, B., Marec, R., Calvel, P., Bezerra, F., and Ecoffet, R.

Subjects
IONIZING radiation dosage, OPERATIONAL amplifiers, ELECTRONIC amplifiers, ASTROPHYSICAL radiation, IRRADIATION
Abstract

The synergistic effect between Total Ionizing Dose (TID) and Analog Single Event Transient (ASET) in LM124 operational amplifiers (opamps) from three different manufacturers is investigated. This effect is clearly identified on only two manufacturers by three, highlighting manufacturer dependent. In fact, significant variations were observed on both the TID sensitivity and the ASET response of LM124 devices from different manufacturers. Hypotheses are made on the cause of the differences observed. A previously developed ASET simulation tool is used to model the transient response. The effects of TID on devices are taken into account in the model by injecting the variations of key electrical parameters obtained during Co^60 irradiation. An excellent agreement is observed between the experimental responses and the model outputs, independently of the TID level, the bias configuration and the manufacturer of the device. [ABSTRACT FROM PUBLISHER]

Published
2013
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2. Investigation of Flip-Flop Effects in a Linear Analog Comparator-With-Hysteresis Circuit.

Author

Roche, Nicolas J.-H., Buchner, S. P., Roig, F., Dusseau, L., Warner, J. H., Boch, J., McMorrow, D., Saigne, F., Auriel, G., and Azais, B.

Subjects
*SINGLE event effects, *HYSTERESIS loop, *LINEAR statistical models, *COMPARATOR circuits, *SIMULATION methods & models, *POWER supply circuits
Abstract

The impact of the positive feedback loop on analog single event transient (ASET) shapes was investigated for a comparator-with-hysteresis circuit. Simulation based on previous developed ASET simulation tool is used to model the impact of the power supply voltage, the input voltage level and the injected energy. Simulation results show that these kinds of circuits are sensitive to flip-flop effects. This phenomenon occurs if the input voltage is in the hysteresis band range. In this case, simulations show that the ASET can latch the output into a non-desired state by changing the state of the circuit on his transfer characteristic curves. Laser experiments were conducted and show that the simulation outputs are in agreement with the experimental collected data. [ABSTRACT FROM AUTHOR]

Published
2013
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3. Development of a New Methodology to Model the Synergistic Effects Between TID and ASETs.

Author

Roche, Nicolas J.-H., Dusseau, L., Boch, J., Velo, Y. Gonzalez, Vaillé, J.-R., Saigné, F., Auriel, G., Azais, B., Buchner, S. P., Marec, R., Calvel, P., and Bezerra, F.

Subjects
ELECTRIC circuit analysis, ANALOG integrated circuits, OPERATIONAL amplifiers, INTEGRATED circuits, ELECTRONIC amplifiers
Abstract

A high level model is developed using circuit analysis to predict the synergy effect observed on a three stages operational amplifier. This model makes possible to explain and to predict the analog single event transients propagation in circuitry. The effect of total ionizing dose is taken into account by varying the model parameters using the monitoring of the usual supply current induced degradation of the operational amplifier. [ABSTRACT FROM AUTHOR]

Published
2010
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