1. Effect of Na presence during CuInSe2 growth on stacking fault annihilation and electronic properties.
- Author
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Stange, H., Brunken, S., Hempel, H., Rodriguez-Alvarez, H., Sch€afer, N., Greiner, D., Scheu, A., Lauche, J., Kaufmann, C. A., Unold, T., Abou-Ras, D., and Mainz, R.
- Subjects
SODIUM ,STACKING faults (Crystals) ,ANNIHILATION reactions ,COPPER films ,X-ray diffraction - Abstract
While presence of Na is essential for the performance of high-efficiency Cu(In,Ga)Se
2 thin film solar cells, the reasons why addition of Na by post-deposition treatment is superior to pre-deposition Na supply--particularly at low growth temperatures--are not yet fully understood. Here, we show by X-ray diffraction and electron microscopy that Na impedes annihilation of stacking faults during the Cu-poor/Cu-rich transition of low temperature 3-stage co-evaporation and prevents Cu homogeneity on a microscopic level. Lower charge carrier mobilities are found by optical pump terahertz probe spectroscopy for samples with remaining high stacking fault density, indicating a detrimental effect on electronic properties if Na is present during growth. [ABSTRACT FROM AUTHOR]- Published
- 2015
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