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4 results on '"Pedersoli, Emanuele"'

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1. A sub-100 nm thickness flat jet for extreme ultraviolet to soft X-ray absorption spectroscopy.

2. Single‐shot experiments at the soft X‐FEL FERMI using a back‐side‐illuminated scientific CMOS detector.

3. Effect of Auger recombination on transient optical properties in XUV and soft X-ray irradiated silicon nitride.

4. Multipurpose end-station for coherent diffraction imaging and scattering at FERMI@Elettra free-electron laser facility.

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