Search

This paper delivers a considerable improvement in the framework of the statistical simulation of highly nonlinear devices via polynomial chaos-based circuit equivalents. Specifically, a far more efficient and “black-box” approach is proposed that reduces the model complexity for nonlinear components. Based on recent literature, the “stochastic testing” method is used in place of a Galerkin approach to find the pertinent circuit equivalents. The technique is demonstrated via the statistical analysis of a low-noise power amplifier and its features in terms of accuracy and efficiency are highlighted. [ABSTRACT FROM AUTHOR]

This letter addresses the stochastic analysis of nonlinear switching power converters via an augmented circuit equivalent and a single deterministic SPICE simulation. The proposed approach is based on the expansion of the constitutive relations of the circuit elements in terms of orthonormal polynomials within the well-established framework of polynomial chaos. The feasibility and strength of the method are demonstrated on a dc-dc boost converter described by either detailed nonlinear components or via its averaged linear circuit. Excellent modeling accuracy as well as remarkable speed-ups compared to traditional sampling-based approaches are achieved. [ABSTRACT FROM AUTHOR]

This paper presents a numerical procedure for the calculation of the polynomial chaos (PC)-expansion coefficients for the per-unit-length capacitance and inductance matrices of wire structures affected by random parameter variability. According to the recent literature results, these coefficients in turn allow the generation of electrical circuit models for stochastic cables. The procedure is based on the twofold expansion of the nonuniform and stochastic charge distributions on the wire boundaries in terms of both Fourier and PC expansions. A stochastic Galerkin method allows to cast the problem in terms of a deterministic system of equations, whose solution provides the unknown coefficients. The proposed methodology is validated via the generation of statistical models for wire structures with random parameters, whose probabilistic responses are compared against the results of Monte Carlo simulations. [ABSTRACT FROM PUBLISHER]

This paper presents an alternative modeling strategy for the stochastic analysis of high-speed interconnects. The proposed approach takes advantage of the polynomial chaos framework and a fully SPICE-compatible formulation to avoid repeated circuit simulations, thereby alleviating the computational burden associated with traditional sampling-based methods such as Monte Carlo. Nonetheless, the technique offers very good accuracy and the opportunity to easily simulate complex interconnect topologies which include lossy and dispersive transmission lines, thus overcoming the limitations of previous formulations. Application examples involving the stochastic analysis of on-chip and on-board interconnects validate the methodology proposed. [ABSTRACT FROM AUTHOR]

This paper addresses the generation of an enhanced stochastic model of a carbon nanotube interconnect including the effects of process variation. The proposed approach is based on the expansion of the constitutive relations of state-of-the-art deterministic models of nanointerconnects with uncertain parameters in terms of orthogonal polynomials. The method offers comparable accuracy and improved efficiency with respect to conventional methods like Monte Carlo in predicting the statistical behavior of the electrical performance of next-generation data links. An application example involving both the frequency- and time-domain analysis of a realistic nanointerconnect concludes this paper. [ABSTRACT FROM AUTHOR]

This paper focuses on the derivation of an enhanced transmission-line model allowing the stochastic analysis of a realistic multiconductor interconnect. The proposed model, which is based on the expansion of the well-known telegraph equations in terms of orthogonal polynomials, includes the variability of geometrical or material properties of the interconnect due to uncertainties like fabrication process or temperature. A real application example involving the frequency-domain analysis of a coupled microstrip and the computation of the parameters variability effects on the transmission-line response concludes this paper. [ABSTRACT FROM PUBLISHER]

This paper provides an effective solution for the simulation of cables and interconnects with the inclusion of the effects of parameter uncertainties. The problem formulation is based on the telegraphers equations with stochastic coefficients, whose solution requires an expansion of the unknown parameters in terms of orthogonal polynomials of random variables. The proposed method offers accuracy and improved efficiency in computing the parameter variability effects on system responses with respect to the conventional Monte Carlo approach. The approach is validated against results available in the literature, and applied to the stochastic analysis of a commercial multiconductor flat cable. [ABSTRACT FROM AUTHOR]

Recently, an efficient stochastic modeling method for interconnects with inherent variability in their physical parameters was proposed, based on applying the so-called polynomial chaos (PC) approach in conjunction with a Stochastic Galerkin Method (SGM) onto telegrapher's equations. Although this approach was already very successful from a numerical point of view, the novel technique could not be conveniently integrated into SPICE-like solvers, limiting the applicability of the method. In this letter, the PC-SGM scheme for telegrapher's equations is revisited, pinpointing the origin of this inconvenience and immediately allowing to mitigate the issue. By adapting the traditional discretization of the stochastic telegrapher's equations approach, an augmented, yet deterministic, set of ordinary differential equations is obtained that turns out to be of the same type as the telegrapher's equations, and hence, the physical property of reciprocity is preserved. Consequently, it can be directly and more efficiently handled using SPICE-like solvers, which usually assume matrix symmetries. As an application example, the variability analysis of a state-of-the-art on-chip line for millimeter-wave applications is performed in a SPICE solver. [ABSTRACT FROM PUBLISHER]