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As trapping sites for surface charges, the surface trap is an important factor affecting the insulation performance of the epoxy–SF6 interface, which is closely related to the microstructure and its evolution. However, existing studies often ignore the effect of the degradation of the epoxy surface on the surface traps and charge accumulation during the long-term service of the insulation system. In this study, the surface physicochemical evolution and its influence on surface traps of a typical epoxy–SF6 insulation structure were researched under a DC-temperature gradient condition, and an evolution mechanism of surface traps was proposed. The results show that the free radicals introduced during the material degradation process increase the density and depth of both positive and negative charge traps on the epoxy surface. The effect of free radicals formed by the cleavage of epoxy molecules on the electronic orbital and molecular electrostatic potential of epoxy molecules is the intrinsic reason for the evolution of surface trap evolution. This work may help to understand the long-term evolution mechanisms of the physicochemical characteristics of the epoxy–SF6 interface in DC field and may provide a theoretical basis for the long-term failure mechanism revealing and the insulation performance enhancement. [ABSTRACT FROM AUTHOR]

The charge accumulation phenomenon at the gas–solid interface under the co-action of DC electric field and temperature gradient is of great significance, but its long-time evolution characteristics are still unclear. In this work, the accumulation and dissipation characteristics of the surface charge on the epoxy-SF6 interface within 216 h were obtained, indicating that, (a) the normal surface electric field is increased by the temperature gradient along the gas–solid interface, which results in a prominent increase in the surface charge density; (b) there are different evolution processes of surface charge in high and low temperature regions under the co-action of DC-temperature gradient, and the increase of the charge trap density caused by the degradation of solid material is considered to be an important reason for the charge evolution; (c) the total charge dissipation ratio within 600 s decreases with the increase of charging time in DC electric field, and the surface charge dissipates mainly to the gas side of the interface; (d) the large amount of charge accumulated at the interface distorts the surface electric field at the triple junction points. The total electric field strength at the low-temperature tri-junction point increases by 35.5%, while the direction of the tangential field at the high-temperature tri-junction point reverses during the long-time co-action of the DC-temperature gradient. The results of this work may be helpful to understand the long-time charge evolution characteristics of the gas–solid interface under the DC-temperature gradient and to reveal the failure mechanism of the gas–solid interface. [ABSTRACT FROM AUTHOR]

DC wall bushing is one of the key equipment in high-voltage direct current (HVDC) transmission project. At present, post insulators based on epoxy composites are widely used for supporting insulation in SF6-insulated apparatus. However, the flashover faults caused by surface charge accumulation can be a severe threat to the long-term operation of the post insulators under dc field. Therefore, the issue of charge accumulation on epoxy post insulators in HVDC wall bushing and its effect on flashover has been widely concerned. Aiming at this problem, the flashover characteristics of epoxy samples in SF6 gas under polarity reversal conditions with dc voltage prestressed for 10–600 min were measured in this article. The flashover process is analyzed through surface charge distribution measurement and electric field computation. The results show that with the increase of prestressed time, the accumulated negative charge density could reach $-14.8\,\,\mu \text{C}/\text{m}^{{2}}$ , which led to a 12% increase in maximum field strength. As a result, the polarity reversal flashover voltage could decrease by 12% and the flashover time delay could decrease by 84.6%. This article can offer as a reference for the effect of surface charge accumulation on flashover in SF6 gas-insulated equipment. [ABSTRACT FROM AUTHOR]