1. Lensless X-ray imaging in reflection geometry
- Author
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S. D. Kevan, Weilun Chao, R. Su, E. H. Anderson, Sujoy Roy, Joshua J. Turner, K. A. Seu, Stefano Cabrini, and D. Parks
- Subjects
Diffraction ,Materials science ,Scattering ,business.industry ,Holography ,Nanophotonics ,Physics::Optics ,Coherent diffraction imaging ,Atomic and Molecular Physics, and Optics ,Ptychography ,Electronic, Optical and Magnetic Materials ,law.invention ,symbols.namesake ,Optics ,Fourier transform ,Reflection (mathematics) ,law ,Computer Science::Computer Vision and Pattern Recognition ,symbols ,business - Abstract
Lensless X-ray imaging techniques such as coherent diffraction imaging and ptychography, and Fourier transform holography can provide time-resolved, diffraction-limited images. Nearly all examples of these techniques have focused on transmission geometry, restricting the samples and reciprocal spaces that can be investigated. We report a lensless X-ray technique developed for imaging in Bragg and small-angle scattering geometries, which may also find application in transmission geometries. We demonstrate this by imaging a nanofabricated pseudorandom binary structure in small-angle reflection geometry. The technique can be used with extended objects, places no restriction on sample size, and requires no additional sample masking. The realization of X-ray lensless imaging in reflection geometry opens up the possibility of single-shot imaging of surfaces in thin films, buried interfaces in magnetic multilayers, organic photovoltaic and field-effect transistor devices, or Bragg planes in a single crystal.
- Published
- 2011
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