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2 results on '"Smedes, T."'

1. Pitfalls for CDM calibration procedures

Author

Smedes, T., Polewski, M., van IJzerloo, A., Lefebvre, J.L., and Dekker, M.

Subjects
*CALIBRATION, *BANDWIDTHS, *MEASUREMENT, *TESTING, *MATHEMATICAL models, *SIGNAL processing
Abstract

Abstract: A product qualification gave very different results for CDM testing between three labs. This paper describes the investigation into the root cause of these differences. The most relevant issues are the measurement bandwidth and the quality of the calibration modules. An improved procedure is proposed. [Copyright &y& Elsevier]

Published
2013
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2. ESD testing of devices, ICs and systems

Author

Smedes, T.

Subjects
*ELECTRIC discharges, *TESTING, *ELECTRONIC appliance testing, *INTEGRATED circuits, *ELECTRONIC systems, *ELECTRONICS
Abstract

Abstract: This tutorial discusses several ways of ESD testing for devices, ICs and systems. A good understanding of the methods and the physics is required for relating test results to each other. The tutorial ends with an outlook on extensions of the current methods and a discussion on required ESD qualification levels. [Copyright &y& Elsevier]

Published
2009
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