Author: "Mickevičius S" / Topic: thin films - Searchworks@Jio Institute Digital Library Search Results

Your search keyword '"Mickevičius S"' showing total 6 results

Start Over Author "Mickevičius S" Topic thin films

Author: Masys, Š., Jonauskas, V., Baškys, E., Mickevičius, S., and Grebinskij, S.
Subjects: CHEMICAL structure, CHEMICAL affinity, SOLID state electronics, THIN films, SURFACE coatings, ATOMIC structure, PHOTOELECTRICITY
Abstract: We present experimental and theoretical study on valence-band structure of epitaxial SrRuO3 thin films. Experimentally electronic structure of epitaxial SrRuO3 thin films was obtained from resonant photoemission spectra using synchrotron radiation. Theoretical calculations were performed within density functional theory framework employing generalized gradient approximation for exchange-correlation functionals. A good agreement between experiment and theory indicates the suitability of applied analysis methods. [ABSTRACT FROM AUTHOR]
Published: 2012

Author: BaŠkysa, E., Bondarenka, V., Grebinskij, S., Senulis, M., and Mickevičius, S.
Subjects: THIN films, SPECTRUM analysis, SOLID state electronics, PHOTOELECTRON spectroscopy, PHOTOELECTRICITY, MOLECULAR orbitals
Abstract: Thin LaNiO3 films were prepared by reactive DC magnetron sputtering. X-ray photoelectron spectroscopy was used to determine the variation of the oxygen states in films under high temperature annealing and after Ar+ ions bombardment. The experimental O 1s spectra was analyzed for the "as grown" samples, after their thermal treatment, and after Ar+ bombardment of the samples. For the "as grown "samples O 1s peak consists of three components which corresponds to O2- ions, oxygen in (OH)- groups and oxygen in water molecules. After thermal treatment (820 K; 30 h) and after Ar+ polishing (2 keV, 2 μA·cm-2, 1 min.) O 1s peak consists only of two components corresponding to O2- ions and oxygen in (OH)- groups, that is occurs the dehydration of the films. [ABSTRACT FROM AUTHOR]
Published: 2012

Author: Masys, Š., Jonauskas, V., Mickevičius, S., and Grebinskij, S.
Subjects: X-ray photoelectron spectroscopy, THIN films, CRYSTALS, HARTREE-Fock approximation, ELECTRONIC structure
Abstract: We present the experimental and theoretical study of X-ray photoelectron spectroscopy spectrum of LaNiO3-x thin films deposited onto a (100)-plane oriented NdGaO3 substrate. LaNiO3-x thin films demonstrate an excellent in-plane orientation and the surface La/Ni ratio is close to the bulk stoichiometric value. Our theoretical crystal calculations, based on density functional theory approach, show a good agreement with experimental spectrum, whereas relativistic molecular Hartree-Fock study reveals the importance of spin-orbit interaction to the electronic structure of LaNiO3. [ABSTRACT FROM AUTHOR]
Published: 2010

Author: Mickevičius, S., Grebinskij, S., Bondarenka, V., Lisauskas, V., Šliužienė, K., Tvardauskas, H., Vengalis, B., Orlowski, B.A., Osinniy, V., and Drube, W.
Subjects: *THIN films, *SOLID state electronics, *ELECTROMAGNETIC waves, *RADIATION
Abstract: Abstract: The chemical structure and possible hydro-oxidation of LaNiO3−δ films were studied by means of tuneable high-energy X-ray photoelectron spectroscopy using synchrotron radiation. It was shown that the hydroxyl-containing phase, located near the film surface, may be attributed to the lanthanum and nickel hydroxide species. The thickness of a hydroxide-enriched layer was estimated from the oxide/hydroxide ratio measured at normal and grazing conditions. The hydroxide layer thickness was about 2nm for step and/or exponential hydroxide spatial distribution. [Copyright &y& Elsevier]
Published: 2009
Full Text: View/download PDF

Author: Mickevičius, S., Grebinskij, S., Bondarenka, V., Vengalis, B., Šliužienė, K., Orlowski, B.A., Osinniy, V., and Drube, W.
Subjects: *THIN films, *SPECTRUM analysis, *SOLID state electronics, *THICK films
Abstract: Abstract: Epitaxial thin films of LaNiO3−x were deposited by using a reactive d.c. magnetron sputtering technique. High-energy X-ray photoelectron spectroscopy was used to analyze the composition and valence states of La and Ni in the films after long time aging in atmosphere. The obtained results show the existence lanthanum and nickel in oxide and hydroxide chemical states. The oxygen exists in four chemical states: lattice oxides, hydroxyl groups and in adsorbed water. Comparison of the spectra recorded at normal emission and grazing emission angle revealed that the hydroxyl group''s concentration is mostly present at the surface of the film. [Copyright &y& Elsevier]
Published: 2006
Full Text: View/download PDF

Author: Grebinskij, S., Senulis, M., Tvardauskas, H., Bondarenka, V., Lisauskas, V., Vengalis, B., Orlowski, B.A., Johnson, R.L., and Mickevičius, S.
Subjects: *ELECTRONIC structure, *STRONTIUM compounds, *THIN films, *PHOTOEMISSION, *EPITAXY, *SYNCHROTRON radiation, *SURFACE chemistry, *VALENCE (Chemistry)
Abstract: Abstract: The electronic structure of epitaxial SrRuO3 thin films annealed at 300°C in ultra high vacuum is studied by resonant photoemission spectroscopy using synchrotron radiation. The valence band photoemission spectra show a good agreement with theoretical band structure calculations indicating a good quality of the film surface. A method was proposed, which allows extracting the partial density of states in the case of weak and broad resonance. The Ru 4d spectral weights obtained experimentally are in a very good agreement with theoretical predictions, confirming a strong mixing between Ru 4d and O 2p states, as well as the signature of electron correlation near the Fermi level in SrRuO3. [Copyright &y& Elsevier]
Published: 2011
Full Text: View/download PDF

Books, media, physical & digital resources

Searchworks