1. Excitonic absorption in ZnI2 films.
- Author
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Vedeshwar, Agnikumar G. and Tyagi, Pankaj
- Subjects
- *
ZINC halides , *THIN films , *BINDING energy , *ABSORPTION spectra , *EXTRAPOLATION , *ANISOTROPY , *STOICHIOMETRY - Abstract
Optical absorption measurements were carried out at room temperature on stoichiometric and well characterized vacuum evaporated ZnI2 films as function of film thickness and heat-treatment temperatures. The films were transparent and tetragonally structured. X-ray diffraction analysis reveals residual strain on the crystal planes parallel to film thickness. Optical absorption shows three distinct peaklike structures at 3, 3.5 (attributed to be excitonic), and 4.1 eV. The residual strains as well as all the absorption structures vary with film thickness and treatment temperatures. Combining all the data from the two experiments, we find that the two excitonic peaks blueshift with residual strain of (104). The strain-free values for all the above quantities have been determined by the extrapolation of their linear dependence on residual strain. The excitonic absorption observed at room temperature shows a large excitonic binding energy of 150 meV. [ABSTRACT FROM AUTHOR]
- Published
- 2006
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