1. Nucleation and growth of the elongated α′-SiAlON
- Author
-
Xu Fangfang, Thommy Ekström, Wen Shulin, and Lars-Olov Nordberg
- Subjects
Sialon ,Materials science ,Nucleation ,Crystal structure ,Epitaxy ,Crystallography ,Transmission electron microscopy ,visual_art ,Materials Chemistry ,Ceramics and Composites ,visual_art.visual_art_medium ,Ceramic ,Selected area diffraction ,Deposition (law) - Abstract
Nucleation and growth behavior of the elongated α′-SiAlON grains have been studied in α′-SiAlON ceramic with an overall composition Y 0.48 Si 10.00 Al 2.30 O 1.17 N 15.29 prepared by hot-pressing at 1825 °C. Transmission electron microscopy (TEM) and high resolution electron microscopy (HREM) have shown that the elongated α′-SiAlON grains always contain an α-Si 3 N 4 core, implicating heterogeneous nucleation operating in the present system. The growth mode is epitaxial. Selected area diffraction (SAD) and HREM analyses reveal that the crystal structure of the elongated α′-SiAlON has dilated and does not strictly comply with the hexagonal construction, i.e. the c axis tilting by no more than 2 ° is no longer normal to (001) plane, giving a conclusion that the deformed structure, probably formed by local high stress at high temperatures, changes the chemical bonding conditions especially on (001) plane, leading to faster deposition of atoms on (001) plane than on other planes. Additionally, morphology and growth defects have been studied in this paper.
- Published
- 1997