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The spectroscopic and imaging performance of energy-resolved photon counting detectors, based on new sub-millimetre boron oxide encapsulated vertical Bridgman cadmium zinc telluride linear arrays, are presented in this work. The activities are in the framework of the AVATAR X project, planning the development of X-ray scanners for contaminant detection in food industry. The detectors, characterized by high spatial (250 µm) and energy (<3 keV) resolution, allow spectral X-ray imaging with interesting image quality improvements. The effects of charge sharing and energy-resolved techniques on contrast-to-noise ratio (CNR) enhancements are investigated. The benefits of a new energy-resolved X-ray imaging approach, termed window-based energy selecting, in the detection of low- and high-density contaminants are also shown. [ABSTRACT FROM AUTHOR]

In this work, the spectroscopic performances of new cadmium–zinc–telluride (CZT) pixel detectors recently developed at IMEM‐CNR of Parma (Italy) are presented. Sub‐millimetre arrays with pixel pitch less than 500 µm, based on boron oxide encapsulated vertical Bridgman grown CZT crystals, were fabricated. Excellent room‐temperature performance characterizes the detectors even at high‐bias‐voltage operation (9000 V cm−1), with energy resolutions (FWHM) of 4% (0.9 keV), 1.7% (1 keV) and 1.3% (1.6 keV) at 22.1, 59.5 and 122.1 keV, respectively. Charge‐sharing investigations were performed with both uncollimated and collimated synchrotron X‐ray beams with particular attention to the mitigation of the charge losses at the inter‐pixel gap region. High‐rate measurements demonstrated the absence of high‐flux radiation‐induced polarization phenomena up to 2 × 106 photons mm−2 s−1. These activities are in the framework of an international collaboration on the development of energy‐resolved photon‐counting systems for high‐flux energy‐resolved X‐ray imaging. [ABSTRACT FROM AUTHOR]

Cadmium--zinc--telluride (CZT) arrays with photon-counting and energyresolving capabilities are widely proposed for next-generation X-ray imaging systems. This work presents the performance of a 2 mm-thick CZT pixel detector, with pixel pitches of 500 and 250 µm, dc coupled to a fast and low-noise ASIC (PIXIE ASIC), characterized only by the preamplifier stage. A custom 16-channel digital readout electronics was used, able to digitize and process continuously the signals from each output ASIC channel. The digital system performs on-line fast pulse shape and height analysis, with a low dead-time and reasonable energy resolution at both low and high fluxes. The spectroscopic response of the system to photon energies below (109Cd source) and above (241Am source) the K-shell absorption energy of the CZT material was investigated, with particular attention to the mitigation of charge sharing and pile-up. The detector allows high bias voltage operation (>5000 V cm-1) and good energy resolution at moderate cooling (3.5% and 5% FWHM at 59.5 keV for the 500 and 250 µm arrays, respectively) by using fast pulse shaping with a low dead-time (300 ns). Charge-sharing investigations were performed using a fine time coincidence analysis (TCA), with very short coincidence time windows up to 10 ns. For the 500 mm pitch array (250 µm pitch array), sharing percentages of 36% (52%) and 60% (82%) at 22.1 and 59.5 keV, respectively, were measured. The potential of the pulse shape analysis technique for chargesharing detection for corner/border pixels and at high rate conditions (250 kcps pixel-1), where the TCA fails, is also shown. Measurements demonstrated that significant amounts of charge are lost for interactions occurring in the volume of the inter-pixel gap. This charge loss must be accounted for in the correction of shared events. These activities are within the framework of an international collaboration on the development of energyresolved photon-counting systems for high-flux energy-resolved X-ray imaging (1-140 keV). [ABSTRACT FROM AUTHOR]

Recently, CdZnTe (CZT) detectors have been widely proposed and developed for room-temperature X-ray spectroscopy even at high fluxes, and great efforts have been made on both the device and the crystal growth technologies. In this work, the performance of new travelling-heater-method (THM)-grown CZT detectors, recently developed at IMEM-CNR Parma, Italy, is presented. Thick planar detectors (3 mm thick) with gold electroless contacts were realised, with a planar cathode covering the detector surface (4.1 mm × 4.1 mm) and a central anode (2 mm × 2 mm) surrounded by a guard-ring electrode. The detectors, characterized by low leakage currents at room temperature (4.7 nA cm−2 at 1000 V cm−1), allow good room-temperature operation even at high bias voltages (>7000 V cm−1). At low rates (200 counts s−1), the detectors exhibit an energy resolution around 4% FWHM at 59.5 keV (241Am source) up to 2200 V, by using commercial front-end electronics (A250F/NF charge-sensitive preamplifier, Amptek, USA; nominal equivalent noise charge of 100 electrons RMS). At high rates (1 Mcounts s−1), the detectors, coupled to a custom-designed digital pulse processing electronics developed at DiFC of University of Palermo (Italy), show low spectroscopic degradations: energy resolution values of 8% and 9.7% FWHM at 59.5 keV (241Am source) were measured, with throughputs of 0.4% and 60% at 1 Mcounts s−1, respectively. An energy resolution of 7.7% FWHM at 122.1 keV (57Co source) with a throughput of 50% was obtained at 550 kcounts s−1 (energy resolution of 3.2% at low rate). These activities are in the framework of an Italian research project on the development of energy-resolved photon-counting systems for high-flux energy-resolved X-ray imaging. [ABSTRACT FROM AUTHOR]

The success of cadmium zinc telluride (CZT) detectors in room-temperature spectroscopic X-ray imaging is now widely accepted. The most common CZT detectors are characterized by enhanced-charge transport properties of electrons, with mobility-lifetime products μeτe > 10−2 cm2/V and μhτh > 10−5 cm2/V. These materials, typically termed low-flux LF-CZT, are successfully used for thick electron-sensing detectors and in low-flux conditions. Recently, new CZT materials with hole mobility-lifetime product enhancements (μhτh > 10−4 cm2/V and μeτe > 10−3 cm2/V) have been fabricated for high-flux measurements (high-flux HF-CZT detectors). In this work, we will present the performance and charge-sharing properties of sub-millimeter CZT pixel detectors based on LF-CZT and HF-CZT crystals. Experimental results from the measurement of energy spectra after charge-sharing addition (CSA) and from 2D X-ray mapping highlight the better charge-collection properties of HF-CZT detectors near the inter-pixel gaps. The successful mitigation of the effects of incomplete charge collection after CSA was also performed through original charge-sharing correction techniques. These activities exist in the framework of international collaboration on the development of energy-resolved X-ray scanners for medical applications and non-destructive testing in the food industry. [ABSTRACT FROM AUTHOR]

Multiple coincidence events from charge-sharing and fluorescent cross-talk are typical drawbacks in room-temperature semiconductor pixel detectors. The mitigation of these distortions in the measured energy spectra, using charge-sharing discrimination (CSD) and charge-sharing addition (CSA) techniques, is always a trade-off between counting efficiency and energy resolution. The energy recovery of multiple coincidence events is still challenging due to the presence of charge losses after CSA. In this work, we will present original techniques able to correct charge losses after CSA even when multiple pixels are involved. Sub-millimeter cadmium–zinc–telluride (CdZnTe or CZT) pixel detectors were investigated with both uncollimated radiation sources and collimated synchrotron X rays, at energies below and above the K-shell absorption energy of the CZT material. These activities are in the framework of an international collaboration on the development of energy-resolved photon counting (ERPC) systems for spectroscopic X-ray imaging up to 150 keV. [ABSTRACT FROM AUTHOR]