1. Stacked Fresnel Zone Plates for High Energy X-rays.
- Author
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Snigireva, Irina, Snigirev, Anatoly, Vaughan, Gavin, Di Michiel, Marco, Kohn, Viktor, Yunkin, Vyacheslav, and Grigoriev, Maxim
- Subjects
X-rays ,SILICON ,ELECTROMAGNETIC waves ,IONIZING radiation ,RADIATION ,NONMETALS - Abstract
A stacking technique was developed in order to increase focusing efficiency of Fresnel zone plates (FZP) at high energies. Two identical Si chips each of which containing 9 FZPs were used for stacking. Alignment of the chips was achieved by on-line observation of the moiré pattern. The formation of moiré patterns was studied theoretically and experimentally at different experimental conditions. To provide the desired stability Si-chips were bonded together with slow solidification speed epoxy glue. A technique of angular alignment in order to compensate a linear displacement in the process of gluing was proposed. Two sets of stacked FZPs were experimentally tested to focus 15 and 50 keV x rays. The gain in the efficiency by factor 2.5 was demonstrated at 15 keV. The focal spot of 1.8 μm vertically and 14 μm horizontally with 35% efficiency was measured at 50 keV. Forecast for the stacking of nanofocusing FZPs was discussed. © 2007 American Institute of Physics [ABSTRACT FROM AUTHOR]
- Published
- 2007
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