1. Sensitivity Enhancement of Ultraviolet Photodetectors With the Structure of p-NiO/Insulator-SiO2/n-ZnO Nanowires.
- Author
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Li, Yu-Ren, Wan, Chung-Yun, Chang, Chia-Tsung, Huang, Yu-Chih, Tsai, Wan-Lin, Lee, I-Che, and Cheng, Huang-Chung
- Subjects
PHOTODETECTORS ,NICKEL oxides ,ZINC oxide ,NANOWIRES ,CURRENT density (Electromagnetism) ,ULTRAVIOLET radiation - Abstract
A high-performance photodetector with the structure of NiO/SiO2/ZnO nanowires has been proposed. The devices with 6-nm-thick SiO2 exhibited a better rectification ratio ( J\mathrm {forward} / J\mathrm {reverse}) of 246 at ±2 V, lower dark current density ( J\mathrm {dark}) of 3.5\times 10^\mathrm -7 A/cm ^2 at a reverse bias of 2 V, and superior ultraviolet (UV) sensitivity ( I\mathrm {UV} / I\mathrm {dark}) of 16.23 than those without the SiO2 layer ( J\mathrm {forward} / J\mathrm {reverse} = 44, J\mathrm {dark} = 4.7\times 10^{\mathrm {-6}} A/cm ^2 , and I\mathrm {UV} / I\mathrm {dark} = 5.5) . The improved performance was mainly due to the ultrathin inserted SiO2 layer that builds a barrier height to minimize the transmission probability of low-energy carriers, leading to the enhancement of the UV sensing characteristics. [ABSTRACT FROM AUTHOR]
- Published
- 2015
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