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2 results on '"Roberts, Gordon W."'

1. ITC Highlights.

Author

Roberts, Gordon W. and Aitken, Robert C.

Subjects
INTEGRATED circuit design, ELECTRONIC circuit design, SEMICONDUCTORS testing, CONFERENCES & conventions
Abstract

Reports on the 2003 International Test Conference, a conference focusing on developments in design and testing of integrated circuits. Highlights of the conference held in Charlotte, North Carolina; Technical programs; Panel sessions and topics; Board test.

Published
2003

2. ITC 2003: Breaking Test Interface Bottlenecks.

Author

Aitken, Robert C. and Roberts, Gordon W.

Subjects
INTEGRATED circuit design, ELECTRONIC circuit design, SEMICONDUCTORS testing, CONFERENCES & conventions
Abstract

Focuses on the 2003 International Test Conference, a conference held in Charlotte, North Carolina, highlighting developments in testing and designs in manufacture of integrated circuits. Need for development of testing equipment; Factors that limit test speeds; Papers presented during the conference.

Published
2003

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