356 results on '"Akin, Bilal"'
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52. Turn-on Delay Based Real-Time Junction Temperature Measurement for SiC MOSFETs With Aging Compensation
53. Effect of Magnets Asymmetry on Stray Magnetic Flux Based Bearing Damage Detection in PMSM
54. A Stray Magnetic Flux-Based Robust Diagnosis Method for Detection and Location of Interturn Short Circuit Fault in PMSM
55. Health State Estimation and Remaining Useful Life Prediction of Power Devices Subject to Noisy and Aperiodic Condition Monitoring
56. A Composite Failure Precursor for Condition Monitoring and Remaining Useful Life Prediction of Discrete Power Devices
57. Phase-sensitive detection of motor fault signatures in the presence of noise
58. Design Methodology of DC Power Cycling Test Setup for SiC MOSFETs
59. Low order PWM inverter harmonics contributions to the inverter-fed induction machine fault diagnosis
60. Finite-element transient analysis of induction motors under mixed eccentricity fault
61. Evaluation of Aging's Effect on Temperature-Sensitive Electrical Parameters in SiC mosfets
62. In situ Degradation Monitoring of SiC MOSFET Based on Switching Transient Measurement
63. A System Level Approach for Online Junction Temperature Measurement of SiC MOSFETs Using Turn-On Delay Time
64. A Practical On-Board SiC MOSFET Condition Monitoring Technique for Aging Detection
65. Spatial Inductance Estimation for Current Loop Auto-Tuning in IPMSM Self-Commissioning
66. Experimental Evaluation and Analysis of Switching Transient's Effect on Dynamic on-Resistance in GaN HEMTs
67. Severity Estimation of Interturn Short Circuit Fault for PMSM
68. Investigation of Performance Degradation in Power MOSFET under OFF-State Avalanche Breakdown Test
69. Investigation of Aging’s Effect on the Conduction and Switching Loss in SiC MOSFETs
70. Inertia Estimation and Speed Loop Auto-Tuning for IPMSM Self-Commissioning
71. Efficient motor control for HVAc appliances
72. A Fast Phase Variable$abc$Model of Brushless PM Motors Under Demagnetization Faults
73. SiC MOSFET Aging Detection Based on Miller Plateau Voltage Sensing
74. On-Board SiC MOSFET Degradation Monitoring Through Readily Available Inverter Current/Voltage Sensors
75. A Wavelet-Based Fault Diagnosis Approach for Permanent Magnet Synchronous Motors
76. Advanced Severity Monitoring of Interturn Short Circuit Faults in PMSMs
77. Degradation Assessment and Precursor Identification for SiC MOSFETs Under High Temp Cycling
78. Design of a High-Performance DC Power Cycling Test Setup for SiC MOSFETs
79. Impact of Threshold Voltage Instability on Static and Switching Performance of GaN Devices with p-GaN Gate
80. An Investigation on Diagnosis-Based Power Switch Lifetime Extension Strategies for Three-Phase Inverters
81. Real-Time Aging Detection of SiC MOSFETs
82. Analysis of Vth Variations in IGBTs Under Thermal Stress for Improved Condition Monitoring in Automotive Power Conversion Systems
83. A Robust Method for Induction Motor Magnetizing Curve Identification at Standstill
84. Interturn Short-Circuit Faults in Permanent Magnet Synchronous Machines: An Extended Review and Comprehensive Analysis
85. A Comprehensive Analysis of Short-Circuit Current Behavior in PMSM Interturn Short-Circuit Faults
86. A New LMS Algorithm Based Deadtime Compensation Method for PMSM FOC Drives
87. Thermally Triggered SiC MOSFET Aging Effect on Conducted EMI
88. Quantitative Analysis of Different Operating Conditions' Effect on Dynamic On-Resistance in Enhancement-Mode GaN HEMTs
89. Investigation of Performance Degradation in Enhancement-Mode GaN HEMTs under Accelerated Aging
90. A Simple Plug-In Circuit for IGBT Gate Drivers to Monitor Device Aging: Toward Smart Gate Drivers
91. Digital control: MCU lowers cost and improves efficiency
92. Dictionary Learning for Bearing Fault Diagnosis
93. Design of a Fast Dynamic On-Resistance Measurement Circuit for GaN Power HEMTs
94. Auto Injection Control for In-Circuit Frequency Response Measurement
95. Lifetime Estimation of Discrete IGBT Devices Based on Gaussian Process
96. Investigation of performance degradation in thermally aged cascode GaN power devices
97. Separation of induction motor rotor faults and low frequency load oscillations through the radial leakage flux
98. Aging assessment of discrete SiC MOSFETs under high temperature cycling tests
99. A model-based signal processing method for fault diagnosis in PMSM machine
100. Investigation of EM radiation changes in SiC based converters throughout device aging
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